SW500009 Microchip Technology, SW500009 Datasheet - Page 176

• Manufacturer Part Number: SW500009
• Description: HI-TECH FOR DSPIC/PIC24
• Manufacturer: Microchip Technology
• Type: Compilerr
• Series: PIC24 & DsPICr

Specifications of SW500009

• Supported Families: PIC24
• Core Architecture: PIC, DsPIC
• Software Edition: Standard
• Kit Contents: Software And Docs
• Tool Type: Compiler
• Mcu Supported Families: PIC24 MCUs And DsPIC DSCs
• Lead Free Status / RoHS Status: Not applicable / RoHS Compliant
• For Use With/related Products: DSPIC3X/PIC24
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: 025; 778-1003; 778-1003

__RAM_CELL_TEST
Synopsis
Description
Should not be called from user code. This routine is called from a loop within the generated runtime
startup code if the system requires a RAM integrity test before program execution. Upon entry to this
routine, the FSR register has been loaded with the RAM cell to test. The value 0x55 will be assigned
to the cell and verified, followed by 0xAA. If either of these values fail verification, the routine will
call ram_test_failed() with an error code in the working register and FSR still containing the
address that was in error.
in sequence. If the location being tested contains non volatile data, the value will be backed up before
the test routine is called and restored upon return from the routine.
insufficient for a particular system’s verification.
See also
ram_cell_test()
162
This routine is called repeatedly during startup, with each subsequent call testing the next address
This library routine can be overriden by a user’s implementation if the standard cell tests are
void _ram_cell_test(void)
Library Functions