SW500009 Microchip Technology, SW500009 Datasheet - Page 245

• Manufacturer Part Number: SW500009
• Description: HI-TECH FOR DSPIC/PIC24
• Manufacturer: Microchip Technology
• Type: Compilerr
• Series: PIC24 & DsPICr

Specifications of SW500009

• Supported Families: PIC24
• Core Architecture: PIC, DsPIC
• Software Edition: Standard
• Kit Contents: Software And Docs
• Tool Type: Compiler
• Mcu Supported Families: PIC24 MCUs And DsPIC DSCs
• Lead Free Status / RoHS Status: Not applicable / RoHS Compliant
• For Use With/related Products: DSPIC3X/PIC24
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: 025; 778-1003; 778-1003

Library Functions
RAM_TEST_FAILED
Synopsis
void ram_test_failed (unsigned char errcode)
Description
The ram_test_failed() function is not intended to be called from within the general execution of
the program. This routine is called during execution of the generated runtime startup code if the
program is using a compiler generated RAM integrity test and the integrity test detects a bad cell.
Upon entry to this function, the working register contains an error code, the address that failed
can be determined from the FSR register and IRP bit. The failed value will still be accessable through
the INDF register. The default operation of this routine will halt program execution if a bad cell is
detected, however the user is free to enhance this functionality if required.
See Also
__ram_cell_test
Note
This routine is intended to be replaced by an equivalent routine to suit the user’s implementation.
Possible enhancements include logging the location of the dead cell and continuing to test if there
are any more more dead cells, or alerting the outside world that the device has a memory problem.
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