LEMC2520T4R7M Taiyo Yuden, LEMC2520T4R7M Datasheet - Page 15

• Manufacturer Part Number: LEMC2520T4R7M
• Description: INDUCTOR WOUND 4.7UH 285MA 1008
• Manufacturer: Taiyo Yuden
• Series: LEr

Specifications of LEMC2520T4R7M

• Inductance: 4.7µH
• Current: 285mA
• Tolerance: ±20%
• Dc Resistance (dcr): 700 mOhm Max
• Q @ Freq: 20 @ 7.96MHz
• Self Resonant Freq: 43MHz
• Package / Case: 1008 (2520 Metric)
• Mounting Type: Surface Mount
• Operating Temperature: -40°C ~ 85°C
• Frequency - Test: 7.96MHz
• Applications: General Purpose
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Shielding: -
• Current - Saturation: -
• Current - Temperature Rise: -

19.Damp heat
18.Resisitance to
RELIABILITY DATA
solvent
Item
△L/L→
WithinM10L
Q→
5N6V18N：
10min.
22NVR10：
15min.
R12V1R0：
25min.
1R2V3R3：
20min.
△L/L→
WithinM10L
Q→
10NV18N：
10min.
22NVR10：
15min.
R12V100：
30min.
120V220：
20min.
△L/L→
WithinM10L
Q→
5R6V18N：
10min.
22NVR10：
15min.
R12V1R0：
25min.
1R2V3R3：
20min.
△L/L→
WithinM10L
Q→
10NV18N：
10min.
22NVR10：
15min.
R12V100：
30min.
120V220：
LER012
LER015
△L/L→
WithinM10L
Q→
10N：10min.
12NV33N：
15min.
39NVR10：
20min.
R12V4R7：
30min.
5R6V330：
25min.
390V 820：
20min.
101：15min.
LEM2520
△L/L→
WithinM10L
Q→
10N：10min.
12NV33N：
15min.
39NVR10：
20min.
R12V4R7：
30min.
5R6V330：
25min.
390V820：
20min.
101：15min.
△L/L→WithinM10L
LEMC2520
△L/L→WithinM10L
LEMF2520 LEMC3225 LEMF3225
Specified Value
LB2518
LB2016
LB2012
LB1608
LBC2518
△L/L→
WithinM5L
※△L/L→
withinM0.5nH
under
8.2ｎH
△Q/Q→
withinM20L
※△Q/Q
→within
M5 under
8.2ｎH
△L/L→
WithinM5L
※△L/L→
withinM0.5nH
under
8.2ｎH
△Q/Q→
WithinM20L
※△Q/Q
→within
M5 under
8.2ｎH
LBH1608
Recovery：At least 1 hr of recovery the stan-
Recovery：At least 1 hr of recovery the stan-
Conditions for 1cycle
Temperature ① for：LER012YLER015
Temperature ② for：
LEM2520YLEMC2520YLEMF2520Y
LEMC3225YLEMF3225
Number of cycle：100 cycle
LBYLBCYLBH：
K40VJ85C, miantain times 30min. ,100 cycle
Recovery：At least 1 hr of recovery under
Temperature：60M2C
Humidity：90V95LRH
Duration：1000 hrs
Step TemperaturefCg① TemperaturefCg② Durationfming
1
2
Test Methods and Remarks
K25
J85
dard condition after the removal
from test chamber, followed by
measurement within 2 hrs.
dard condition after the removal
from test chamber, followed by
measurement within 2 hrs.
the standard condition after the
test, followed by the measure-
ment within 2 hrs.
K40
J85
6/8
30
30
209
5