AT91SAM7S321-MU Atmel, AT91SAM7S321-MU Datasheet - Page 47
AT91SAM7S321-MU
Manufacturer Part Number
AT91SAM7S321-MU
Description
MCU ARM 32K HI SPD FLASH 64-QFN
Manufacturer
Atmel
Series
AT91SAMr
Specifications of AT91SAM7S321-MU
Core Processor
ARM7
Core Size
16/32-Bit
Speed
55MHz
Connectivity
I²C, SPI, SSC, UART/USART, USB
Peripherals
Brown-out Detect/Reset, DMA, POR, PWM, WDT
Number Of I /o
32
Program Memory Size
32KB (32K x 8)
Program Memory Type
FLASH
Ram Size
8K x 8
Voltage - Supply (vcc/vdd)
1.65 V ~ 1.95 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
64-VQFN Exposed Pad, 64-HVQFN, 64-SQFN, 64-DHVQFN
Processor Series
AT91SAMx
Core
ARM7TDMI
Data Bus Width
32 bit
Data Ram Size
8 KB
Interface Type
I2C, I2S, SPI, SSC, TWI, UART, USB
Maximum Clock Frequency
55 MHz
Number Of Programmable I/os
32
Number Of Timers
10 bit
Operating Supply Voltage
1.8 V to 3.3 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
JTRACE-ARM-2M, KSK-AT91SAM7S-PL, MDK-ARM, RL-ARM, ULINK2
Development Tools By Supplier
AT91SAM-ICE, AT91-ISP, AT91SAM7S-EK
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit, 8 Channel
For Use With
AT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9AT91SAM7S-EK - KIT EVAL FOR ARM AT91SAM7S
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Details
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
AT91SAM7S321-MU
Manufacturer:
ATMEL
Quantity:
9 500
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12. Debug and Test Features
12.1
12.2
6175K–ATARM–30-Aug-10
Description
Block Diagram
The AT91SAM7S Series Microcontrollers feature a number of complementary debug and test
capabilities. A common JTAG/ICE (EmbeddedICE) port is used for standard debugging func-
tions, such as downloading code and single-stepping through programs. The Debug Unit
provides a two-pin UART that can be used to upload an application into internal SRAM. It man-
ages the interrupt handling of the internal COMMTX and COMMRX signals that trace the activity
of the Debug Communication Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from
a PC-based test environment.
Figure 12-1. Debug and Test Block Diagram
PDC
Boundary
ARM7TDMI
TAP
DBGU
ICE
ICE/JTAG
AT91SAM7S Series Preliminary
TAP
Reset
and
Test
POR
TMS
TCK
TDI
JTAGSEL
TDO
DTXD
DRXD
TST
47
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