ATMEGA16L-8PU Atmel, ATMEGA16L-8PU Datasheet - Page 228
![IC AVR MCU 16K 8MHZ 3V 40DIP](/photos/6/70/67049/453-40-dip_sml.jpg)
ATMEGA16L-8PU
Manufacturer Part Number
ATMEGA16L-8PU
Description
IC AVR MCU 16K 8MHZ 3V 40DIP
Manufacturer
Atmel
Series
AVR® ATmegar
Datasheets
1.ATMEGA16L-8MI.pdf
(26 pages)
2.ATMEGA16L-8MI.pdf
(357 pages)
3.ATMEGA16-16PU.pdf
(358 pages)
Specifications of ATMEGA16L-8PU
Core Processor
AVR
Core Size
8-Bit
Speed
8MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
32
Program Memory Size
16KB (8K x 16)
Program Memory Type
FLASH
Eeprom Size
512 x 8
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
40-DIP (0.600", 15.24mm)
Processor Series
ATMEGA16x
Core
AVR8
Data Bus Width
8 bit
Data Ram Size
1 KB
Interface Type
JTAG/SPI/UART
Maximum Clock Frequency
8 MHz
Number Of Programmable I/os
32
Number Of Timers
3
Operating Supply Voltage
2.7 V to 5.5 V
Maximum Operating Temperature
+ 85 C
Mounting Style
Through Hole
3rd Party Development Tools
EWAVR, EWAVR-BL
Minimum Operating Temperature
- 40 C
On-chip Adc
8-ch x 10-bit
A/d Inputs
8-Channel, 10-Bit
Cpu Speed
8 MIPS
Eeprom Memory
512 Bytes
Input Output
32
Interface
JTAG/SPI/UART
Memory Type
Flash
Number Of Bits
8
Package Type
40-pin PDIP
Programmable Memory
16K Bytes
Timers
2-8-bit, 1-16-bit
Voltage, Range
2.7-5.5 V
For Use With
ATSTK600-TQFP44 - STK600 SOCKET/ADAPTER 44-TQFPATSTK600 - DEV KIT FOR AVR/AVR32770-1007 - ISP 4PORT ATMEL AVR MCU SPI/JTAGATJTAGICE2 - AVR ON-CHIP D-BUG SYSTEMATSTK500 - PROGRAMMER AVR STARTER KIT
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
- Current page: 228 of 357
- Download datasheet (8Mb)
IEEE 1149.1
(JTAG)
Boundary-scan
Features
System Overview
Data Registers
Bypass Register
2466T–AVR–07/10
•
•
•
•
•
The Boundary-scan chain has the capability of driving and observing the logic levels on the digi-
tal I/O pins, as well as the boundary between digital and analog logic for analog circuitry having
Off-chip connections. At system level, all ICs having JTAG capabilities are connected serially by
the TDI/TDO signals to form a long Shift Register. An external controller sets up the devices to
drive values at their output pins, and observe the input values received from other devices. The
controller compares the received data with the expected result. In this way, Boundary-scan pro-
vides a mechanism for testing interconnections and integrity of components on Printed Circuits
Boards by using the four TAP signals only.
The four IEEE 1149.1 defined mandatory JTAG instructions IDCODE, BYPASS, SAMPLE/PRE-
LOAD, and EXTEST, as well as the AVR specific public JTAG instruction AVR_RESET can be
used for testing the Printed Circuit Board. Initial scanning of the Data Register path will show the
ID-code of the device, since IDCODE is the default JTAG instruction. It may be desirable to have
the AVR device in Reset during Test mode. If not reset, inputs to the device may be determined
by the scan operations, and the internal software may be in an undetermined state when exiting
the Test mode. Entering reset, the outputs of any Port Pin will instantly enter the high impedance
state, making the HIGHZ instruction redundant. If needed, the BYPASS instruction can be
issued to make the shortest possible scan chain through the device. The device can be set in
the reset state either by pulling the external RESET pin low, or issuing the AVR_RESET instruc-
tion with appropriate setting of the Reset Data Register.
The EXTEST instruction is used for sampling external pins and loading output pins with data.
The data from the output latch will be driven out on the pins as soon as the EXTEST instruction
is loaded into the JTAG IR-Register. Therefore, the SAMPLE/PRELOAD should also be used for
setting initial values to the scan ring, to avoid damaging the board when issuing the EXTEST
instruction for the first time. SAMPLE/PRELOAD can also be used for taking a snapshot of the
external pins during normal operation of the part.
The JTAGEN Fuse must be programmed and the JTD bit in the I/O Register MCUCSR must be
cleared to enable the JTAG Test Access Port.
When using the JTAG interface for Boundary-scan, using a JTAG TCK clock frequency higher
than the internal chip frequency is possible. The chip clock is not required to run.
The Data Registers relevant for Boundary-scan operations are:
•
•
•
•
The Bypass Register consists of a single Shift Register stage. When the Bypass Register is
selected as path between TDI and TDO, the register is reset to 0 when leaving the Capture-DR
JTAG (IEEE std. 1149.1 Compliant) Interface
Boundary-scan Capabilities According to the JTAG Standard
Full Scan of all Port Functions as well as Analog Circuitry having Off-chip Connections
Supports the Optional IDCODE Instruction
Additional Public AVR_RESET Instruction to Reset the AVR
Bypass Register
Device Identification Register
Reset Register
Boundary-scan Chain
ATmega16(L)
228
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