MC9S08QE4CWJ Freescale Semiconductor, MC9S08QE4CWJ Datasheet - Page 30

• Manufacturer Part Number: MC9S08QE4CWJ
• Description: IC MCU 8BIT 4K FLASH 20-SOIC
• Manufacturer: Freescale Semiconductor
• Series: HCS08r

Specifications of MC9S08QE4CWJ

• Core Processor: HCS08
• Core Size: 8-Bit
• Speed: 20MHz
• Connectivity: I²C, LIN, SCI, SPI
• Peripherals: LVD, PWM, WDT
• Number Of I /o: 16
• Program Memory Size: 4KB (4K x 8)
• Program Memory Type: FLASH
• Ram Size: 256 x 8
• Voltage - Supply (vcc/vdd): 1.8 V ~ 3.6 V
• Data Converters: A/D 8x12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 20-SOIC (7.5mm Width)
• Processor Series: S08QE
• Core: HCS08
• Data Bus Width: 8 bit
• Data Ram Size: 256 B
• Interface Type: SCI/SPI
• Maximum Clock Frequency: 20 MHz
• Number Of Programmable I/os: 26
• Number Of Timers: 2
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: EWS08
• Development Tools By Supplier: DEMOQE128, EVBQE128
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 10-ch x 12-bit
• Controller Family/series: HCS08
• No. Of I/o's: 16
• Ram Memory Size: 512Byte
• Cpu Speed: 20MHz
• No. Of Timers: 2
• Digital Ic Case Style: SOIC
• Rohs Compliant: Yes
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

Ordering Information
3.14.1
Microcontroller transient conducted susceptibility is measured in accordance with an internal Freescale
test method. The measurement is performed with the microcontroller installed on a custom EMC
evaluation board and running specialized EMC test software designed in compliance with the test method.
The conducted susceptibility is determined by injecting the transient susceptibility signal on each pin of
the microcontroller. The transient waveform and injection methodology is based on IEC 61000-4-4
(EFT/B). The transient voltage required to cause performance degradation on any pin in the tested
configuration is greater than or equal to the reported levels unless otherwise indicated by footnotes below
Table
1
The susceptibility performance classification is described in
4
This section contains ordering information for the device numbering system.
Example of the device numbering system:
30
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
Data based on qualification test results. Not tested in production.
Result
19.
A
B
C
D
E
Ordering Information
Parameter
Conducted Transient Susceptibility
Self-recovering
Hard failure
Soft failure
No failure
Damage
failure
Table 20. Susceptibility Performance Classification
Table 19. Conducted Susceptibility, EFT/B
The MCU performs as designed during and after exposure.
The MCU does not perform as designed during exposure. The MCU returns
automatically to normal operation after exposure is removed.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.
Symbol
V
MC9S08QE8 Series Data Sheet, Rev. 8
CS_EFT
package type
32-pin LQFP
Conditions
V
T
DD
A
= 25
= 3.3 V
Performance Criteria
o
C
Table
8 MHz bus
f
OSC
8 MHz
crystal
/f
20.
BUS
Result
A
B
C
D
Freescale Semiconductor
Amplitude
(Min)
>4.0
>4.0
2.3
4.0
1
Unit
kV