PIC18F2510-E/ML Microchip Technology, PIC18F2510-E/ML Datasheet - Page 234
![IC PIC MCU FLASH 16KX16 28QFN](/photos/6/81/68120/150-28-qfn_sml.jpg)
PIC18F2510-E/ML
Manufacturer Part Number
PIC18F2510-E/ML
Description
IC PIC MCU FLASH 16KX16 28QFN
Manufacturer
Microchip Technology
Series
PIC® 18Fr
Datasheets
1.PIC16F616T-ISL.pdf
(8 pages)
2.PIC18F2221-ISO.pdf
(46 pages)
3.PIC18LF2410-ISO.pdf
(376 pages)
4.PIC18LF2410-ISO.pdf
(8 pages)
5.PIC18LF2410-ISO.pdf
(16 pages)
6.PIC18LF2410-ISO.pdf
(6 pages)
7.PIC18LF2410-ISO.pdf
(6 pages)
8.PIC18LF2410-ISO.pdf
(8 pages)
Specifications of PIC18F2510-E/ML
Core Processor
PIC
Core Size
8-Bit
Speed
40MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, HLVD, POR, PWM, WDT
Number Of I /o
25
Program Memory Size
32KB (16K x 16)
Program Memory Type
FLASH
Ram Size
1.5K x 8
Voltage - Supply (vcc/vdd)
4.2 V ~ 5.5 V
Data Converters
A/D 10x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 125°C
Package / Case
28-VQFN Exposed Pad, 28-HVQFN, 28-SQFN, 28-DHVQFN
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Eeprom Size
-
- PIC16F616T-ISL PDF datasheet
- PIC18F2221-ISO PDF datasheet #2
- PIC18LF2410-ISO PDF datasheet #3
- PIC18LF2410-ISO PDF datasheet #4
- PIC18LF2410-ISO PDF datasheet #5
- PIC18LF2410-ISO PDF datasheet #6
- PIC18LF2410-ISO PDF datasheet #7
- PIC18LF2410-ISO PDF datasheet #8
- Current page: 234 of 376
- Download datasheet (7Mb)
PIC18F2X1X/4X1X
FIGURE 21-3:
21.5
In many applications, the ability to detect a drop below
or rise above a particular threshold is desirable. For
example, the HLVD module could be periodically
enabled to detect a Universal Serial Bus (USB) attach
or detach. This assumes the device is powered by a
lower voltage source than the USB when detached. An
attach would indicate a high-voltage detect from, for
example, 3.3V to 5V (the voltage on USB) and vice
versa for a detach. This feature could save a design a
few extra components and an attach signal (input pin).
For general battery applications, Figure 21-4 shows a
possible voltage curve. Over time, the device voltage
decreases. When the device voltage reaches voltage
V
The interrupt could cause the execution of an ISR,
which would allow the application to perform “house-
keeping tasks” and perform a controlled shutdown
before the device voltage exits the valid operating
range at T
a time window, represented by the difference between
T
DS39636D-page 236
A
A
, the HLVD logic generates an interrupt at time T
and T
CASE 1:
CASE 2:
B
Applications
Enable HLVD
, to safely exit.
B
Enable HLVD
. The HLVD thus would give the application
HLVDIF
HLVDIF
IRVST
IRVST
V
V
DD
DD
HIGH-VOLTAGE DETECT OPERATION (VDIRMAG =
HLVDIF may not be set
Internal Reference is stable
Internal Reference is stable
A
T
T
.
IVRST
IVRST
FIGURE 21-4:
HLVDIF cleared in software,
HLVDIF remains set since HLVD condition still exists
V
V
A
B
Legend:
V
V
HLVDIF cleared in software
A
B
1
= HLVD trip point
= Minimum valid device
)
TYPICAL
HIGH/LOW-VOLTAGE
DETECT APPLICATION
operating voltage
© 2009 Microchip Technology Inc.
Time
HLVDIF cleared in software
T
A
V
V
LVD
LVD
T
B
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