AT89C5132-RORUL Atmel, AT89C5132-RORUL Datasheet - Page 14

• Manufacturer Part Number: AT89C5132-RORUL
• Description: MCU 8051 FLASH USB 80TQFP
• Manufacturer: Atmel
• Series: AT89C513xr

Specifications of AT89C5132-RORUL

• Core Processor: C52X2
• Core Size: 8-Bit
• Speed: 20MHz
• Connectivity: IDE/ATAPI, I²C, MMC, PCM, SPI, UART/USART, USB
• Peripherals: I²S, POR, WDT
• Number Of I /o: 44
• Program Memory Size: 64KB (64K x 8)
• Program Memory Type: FLASH
• Eeprom Size: 4K x 8
• Ram Size: 2.25K x 8
• Voltage - Supply (vcc/vdd): 2.7 V ~ 3.3 V
• Data Converters: A/D 2x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 80-TQFP, 80-VQFP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Electrical Characteristics
Absolute Maximum Ratings
DC Characteristics
Digital Logic
Table 1. Digital DC Characteristics
V
18
Storage Temperature ..................................... -65°C to +150°C
Voltage on any other Pin to
I
Power Dissipation ............................................................. 1 W
Ambient Temperature Under Bias.................... -40°C to +85°C
V
DD
OL
Symbol
DD .......................................................................................
V
V
V
V
V
V
per I/O Pin ................................................................. 5 mA
V
OH1
OH2
I
= 2.7 to 3.3V , T
OL1
OL2
IH1
IH2
IL
IL
AT89C5132
Parameter
Input Low Voltage
Input High Voltage (except RST, X1)
Input High Voltage (RST, X1)
Output Low Voltage
(except P0, ALE, MCMD, MDAT, MCLK,
SCLK, DCLK, DSEL, DOUT)
Output Low Voltage
(P0, ALE, MCMD, MDAT, MCLK, SCLK,
DCLK, DSEL, DOUT)
Output High Voltage
(P1, P2, P3, P4 and P5)
Output High Voltage
(P0, P2 address mode, ALE, MCMD,
MDAT, MCLK, SCLK, DCLK, DSEL,
DOUT, D+, D-)
Logical 0 Input Current (P1, P2, P3, P4
and P5)
A
= -40° to +85°C
V
SS
.....................................
2.7V to 3.3V
-0.3 to +4.0V
0.2·V
0.7·V
V
V
DD
DD
Min
-0.5
DD
- 0.7
- 0.7
DD
+ 1.1
(2)
NOTE:
Typ
(1)
0.2·V
Stressing the device beyond the “Absolute Maxi-
mum Ratings” may cause permanent damage.
These are stress ratings only. Operation beyond
the “operating conditions” is not recommended
and extended exposure beyond the “Operating
Conditions” may affect device reliability.
V
DD
Max
0.45
0.45
V
-50
DD
DD
+ 0.5
- 0.1
Units
µA
V
V
V
V
V
V
V
I
I
I
I
Vin = 0.45 V
OL
OL
OH
OH
= 1.6 mA
= 3.2 mA
= -30 µA
= -3.2 mA
Test Conditions
4173CS–USB–07/04