STR912FAZ46H6 STMicroelectronics, STR912FAZ46H6 Datasheet - Page 72
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STR912FAZ46H6
Manufacturer Part Number
STR912FAZ46H6
Description
MCU ARM9 1024KB FLASH 144LFBGA
Manufacturer
STMicroelectronics
Series
STR9r
Datasheet
1.STEVAL-IFW001V1.pdf
(102 pages)
Specifications of STR912FAZ46H6
Core Processor
ARM9
Core Size
32-Bit
Speed
96MHz
Connectivity
CAN, EBI/EMI, Ethernet, I²C, IrDA, Microwire, SPI, SSI, SSP, UART/USART, USB
Peripherals
Brown-out Detect/Reset, DMA, Motor Control PWM, POR, PWM, WDT
Number Of I /o
80
Program Memory Size
1MB (1M x 8)
Program Memory Type
FLASH
Ram Size
96K x 8
Voltage - Supply (vcc/vdd)
1.65 V ~ 2 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
144-LFBGA
Processor Series
STR912x
Core
ARM966E-S
Data Bus Width
16 bit, 32 bit
Data Ram Size
96 KB
Interface Type
CAN, SPI, UART
Maximum Clock Frequency
96 MHz
Number Of Programmable I/os
80
Number Of Timers
4
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWARM, EWARM-BL, MCBSTR9, MCBSTR9U, MCBSTR9UME, KSDK-STR912-PLUS, MDK-ARM, RL-ARM, ULINK2
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit, 8 Channel
For Use With
MCBSTR9UME - BOARD EVAL MCBSTR9 + ULINK-MEMCBSTR9U - BOARD EVAL MCBSTR9 + ULINK2MCBSTR9 - BOARD EVAL STM STR9 SERIES
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Details
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
STR912FAZ46H6
Manufacturer:
ST
Quantity:
101
Company:
Part Number:
STR912FAZ46H6
Manufacturer:
STMicroelectronics
Quantity:
10 000
Electrical characteristics
7.9
7.9.1
Table 27.
1. Data based on characterization results, not tested in production.
72/102
Symbol
V
V
FESD
FFTB
Voltage limits to be applied on
any I/O pin to induce a functional
disturbance
Fast transient voltage burst limits
to be applied through 100pF on
V
functional disturbance
DD
EMS data
EMC characteristics
Susceptibility tests are performed on a sample basis during product characterization.
Functional EMS (electro magnetic susceptibility)
Based on a simple running application on the product (toggling 2 LEDs through I/O ports),
the product is stressed by two electro magnetic events until a failure occurs (indicated by the
LEDs).
●
●
A device reset allows normal operations to be resumed. The test results are given in the
table below based on the EMS levels and classes defined in application note AN1709.
and V
ESD: Electro-Static Discharge (positive and negative) is applied on all pins of the
device until a functional disturbance occurs. This test conforms with the IEC 1000-4-2
standard.
FTB: A Burst of Fast Transient voltage (positive and negative) is applied to V
and V
conforms with the IEC 1000-4-4 standard.
DDQ
Parameter
SS
pins to induce a
through a 100pF capacitor, until a functional disturbance occurs. This test
V
f
V
f
conforms to IEC 1000-4-4
OSC
OSC
DD
DD
Doc ID 13495 Rev 6
=1.8 V, V
= 1.8 V, V
/f
/f
CPUCLK
CPUCLK
DDQ
= 4 MHz/96 MHz PLL
= 4 MHz/96 MHz PLL
DDQ
Conditions
= 3.3 V, T
= 3.3 V, T
A
A
= +25 °C,
= +25 °C,
Criteria
Severity/
1B
4A
STR91xFAxxx
(1)
DD,
V
Unit
DDQ
kV