MC9S08SH16CTL Freescale Semiconductor, MC9S08SH16CTL Datasheet - Page 314

• Manufacturer Part Number: MC9S08SH16CTL
• Description: MCU 8BIT 16K FLASH 28-TSSOP
• Manufacturer: Freescale Semiconductor
• Series: HCS08r

Specifications of MC9S08SH16CTL

• Core Processor: HCS08
• Core Size: 8-Bit
• Speed: 40MHz
• Connectivity: I²C, LIN, SCI, SPI
• Peripherals: LVD, POR, PWM, WDT
• Number Of I /o: 23
• Program Memory Size: 16KB (16K x 8)
• Program Memory Type: FLASH
• Ram Size: 1K x 8
• Voltage - Supply (vcc/vdd): 2.7 V ~ 5.5 V
• Data Converters: A/D 16x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 28-TSSOP
• Processor Series: S08SH
• Core: HCS08
• Data Bus Width: 8 bit
• Data Ram Size: 1 KB
• Interface Type: I2C, SCI, SPI
• Maximum Clock Frequency: 40 MHz
• Number Of Programmable I/os: 23
• Number Of Timers: 2
• Operating Supply Voltage: 5.5 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: EWS08
• Development Tools By Supplier: DEMO9S08SG32, DEMO9S08SG32AUTO, DEMO9S08SG8, DEMO9S08SG8AUTO, DEMO9S08SH32, DEMO9S08SH8
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 10 bit, 12 Channel
• Package: 28TSSOP
• Family Name: HCS08
• Maximum Speed: 40 MHz
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

Appendix A Electrical Characteristics
1
The susceptibility performance classification is described in
314
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
Data based on qualification test results. Not tested in production.
Result
A
B
C
D
E
Parameter
Self-recovering
Hard failure
Soft failure
No failure
Damage
failure
Table A-19. Susceptibility Performance Classification
Table A-18. Conducted Susceptibility, EFT/B
The MCU performs as designed during and after exposure.
The MCU does not perform as designed during exposure. The MCU returns
automatically to normal operation after exposure is removed.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.
MC9S08SH32 Series Data Sheet, Rev. 2
V
Symbol
CS_EFT
PRELIMINARY
package type
Conditions
V
T
A
DD
= +25
TBD
=
Performance Criteria
TBD
o
C
Table
TBD
f
TBD
OSC
crystal
/f
A-19.
bus
BUS
Result
A
B
C
D
Freescale Semiconductor
Amplitude
(Min)
TBD
TBD
TBD
TBD
1
Unit
kV