SAK-XE164HN-16F80L AA Infineon Technologies, SAK-XE164HN-16F80L AA Datasheet - Page 117

• Manufacturer Part Number: SAK-XE164HN-16F80L AA
• Description: IC MCU 16BIT 128KB FLASH 100LQFP
• Manufacturer: Infineon Technologies
• Series: XE16xr

Specifications of SAK-XE164HN-16F80L AA

• Core Processor: C166SV2
• Core Size: 16-Bit
• Speed: 80MHz
• Connectivity: EBI/EMI, I²C, LIN, SPI, SSC, UART/USART, USI
• Peripherals: I²S, POR, PWM, WDT
• Number Of I /o: 75
• Program Memory Size: 128KB (128K x 8)
• Program Memory Type: FLASH
• Ram Size: 18K x 8
• Voltage - Supply (vcc/vdd): 3 V ~ 5.5 V
• Data Converters: A/D 16x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 125°C
• Package / Case: 100-LSQFP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -

4.7.7
The debugger can communicate with the XE164xN either via the 2-pin DAP interface or
via the standard JTAG interface.
Debug via DAP
The following parameters are applicable for communication through the DAP debug
interface.
Note: These parameters are not subject to production test but verified by design and/or
Note: Operating Conditions apply.
Table 37
Table 37
Parameter
DAP0 clock period
DAP0 high time
DAP0 low time
DAP0 clock rise time
DAP0 clock fall time
DAP1 setup to DAP0
rising edge
DAP1 hold after DAP0
rising edge
DAP1 valid per DAP0
clock period
1) See the DAP chapter for clock rate restrictions in the Active::IDLE protocol state.
2) The Host has to find a suitable sampling point by analyzing the sync telegram response.
Table 38
Data Sheet
characterization.
is valid under the following conditions:
is valid under the following conditions:
Debug Interface Timing
2)
DAP Interface Timing for Upper Voltage Range
1)
1)
Symbol
t
t
t
t
t
t
t
t
11
12
13
14
15
16
17
19
SR
SR
SR
SR
SR
SR
SR
CC
Min.
25
8
8
−
−
6
6
17
XE164FN, XE164GN, XE164HN, XE164KN
117
Values
Typ.
−
−
−
−
−
−
−
20
C
C
L
L
= 20 pF; voltage_range= upper
= 20 pF; voltage_range= lower
Max.
−
−
−
4
4
−
−
−
XE166 Family / Value Line
Unit Note /
ns
ns
ns
ns
ns
ns
ns
ns
Electrical Parameters
Test Condition
V1.2, 2010-04