SAK-XE164HN-24F80L AA Infineon Technologies, SAK-XE164HN-24F80L AA Datasheet - Page 120

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SAK-XE164HN-24F80L AA

Manufacturer Part Number
SAK-XE164HN-24F80L AA
Description
IC MCU 16BIT 192KB FLASH 100LQFP
Manufacturer
Infineon Technologies
Series
XE16xr
Datasheet

Specifications of SAK-XE164HN-24F80L AA

Core Processor
C166SV2
Core Size
16-Bit
Speed
80MHz
Connectivity
EBI/EMI, I²C, LIN, SPI, SSC, UART/USART, USI
Peripherals
I²S, POR, PWM, WDT
Number Of I /o
75
Program Memory Size
192KB (192K x 8)
Program Memory Type
FLASH
Ram Size
26K x 8
Voltage - Supply (vcc/vdd)
3 V ~ 5.5 V
Data Converters
A/D 16x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 125°C
Package / Case
100-LSQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Table 39
Parameter
TCK low time
TCK clock rise time
TCK clock fall time
TDI/TMS setup to TCK
rising edge
TDI/TMS hold after TCK
rising edge
TDO valid from TCK falling
edge (propagation delay)
TDO high impedance to
valid output from TCK
falling edge
TDO valid output to high
impedance from TCK
falling edge
TDO hold after TCK falling
edge
1) Under typical conditions, the JTAG interface can operate at transfer rates up to 20 MHz.
2) The falling edge on TCK is used to generate the TDO timing.
3) The setup time for TDO is given implicitly by the TCK cycle time.
Table 40
Table 40
Parameter
TCK clock period
TCK high time
TCK low time
TCK clock rise time
TCK clock fall time
TDI/TMS setup to TCK
rising edge
Data Sheet
2)
is valid under the following conditions:
3)2)
2)
JTAG Interface Timing for Upper Voltage Range (cont’d)
JTAG Interface Timing for Lower Voltage Range
2)
Symbol
t
t
t
t
t
t
t
t
t
Symbol
t
t
t
t
t
t
3
4
5
6
7
8
9
10
18
1
2
3
4
5
6
SR
SR
SR
SR
SR
CC
CC
SR
SR
SR
SR
SR
SR
CC
CC
Min.
16
6
6
5
Min.
50
16
16
6
XE164FN, XE164GN, XE164HN, XE164KN
120
Values
Values
Typ.
25
25
25
Typ.
C
L
= 20 pF; voltage_range= lower
Max.
8
8
29
29
29
Max.
8
8
XE166 Family / Value Line
Unit Note /
ns
ns
ns
ns
ns
ns
ns
ns
ns
Unit Note /
ns
ns
ns
ns
ns
ns
Electrical Parameters
Test Condition
Test Condition
V1.2, 2010-04

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