ATMEGA324P-15MZ Atmel, ATMEGA324P-15MZ Datasheet - Page 265
![MCU AVR 32K FLASH 15MHZ 44-QFN](/photos/12/13/121316/313-44-qfn_sml.jpg)
ATMEGA324P-15MZ
Manufacturer Part Number
ATMEGA324P-15MZ
Description
MCU AVR 32K FLASH 15MHZ 44-QFN
Manufacturer
Atmel
Series
AVR® ATmegar
Specifications of ATMEGA324P-15MZ
Core Processor
AVR
Core Size
8-Bit
Speed
16MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
32
Program Memory Size
32KB (16K x 16)
Program Memory Type
FLASH
Eeprom Size
1K x 8
Ram Size
2K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 125°C
Package / Case
44-VQFN
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
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22.4
7674F–AVR–09/09
TAP Controller
Figure 22-2. TAP Controller State Diagram
The TAP controller is a 16-state finite state machine that controls the operation of the Bound-
ary-scan circuitry, JTAG programming circuitry, or On-chip Debug system. The state transitions
depicted in
transition) at the time of the rising edge at TCK. The initial state after a Power-on Reset is
Test-Logic-Reset.
As a definition in this document, the LSB is shifted in and out first for all Shift Registers.
Assuming Run-Test/Idle is the present state, a typical scenario for using the JTAG interface is:
• At the TMS input, apply the sequence 1, 1, 0, 0 at the rising edges of TCK to enter the Shift
Instruction Register – Shift-IR state. While in this state, shift the four bits of the JTAG
instructions into the JTAG Instruction Register from the TDI input at the rising edge of TCK.
The TMS input must be held low during input of the 3 LSBs in order to remain in the Shift-IR
state. The MSB of the instruction is shifted in when this state is left by setting TMS high. While
the instruction is shifted in from the TDI pin, the captured IR-state 0x01 is shifted out on the
TDO pin. The JTAG Instruction selects a particular Data Register as path between TDI and
TDO and controls the circuitry surrounding the selected Data Register.
1
0
Figure 22-2
Test-Logic-Reset
Run-Test/Idle
0
depend on the signal present on TMS (shown adjacent to each state
1
1
0
Select-DR Scan
Capture-DR
Update-DR
Pause-DR
Exit1-DR
Exit2-DR
Shift-DR
1
0
0
1
0
1
1
ATmega164P/324P/644P
0
1
1
0
0
1
0
Select-IR Scan
Capture-IR
Update-IR
Pause-IR
Exit1-IR
Exit2-IR
1
Shift-IR
0
0
1
0
1
1
0
1
1
0
0
265
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