FDG410NZ Fairchild Semiconductor, FDG410NZ Datasheet - Page 2

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FDG410NZ

Manufacturer Part Number
FDG410NZ
Description
MOSFET N-CH SINGLE 20V SC70-6
Manufacturer
Fairchild Semiconductor
Series
PowerTrench®r
Datasheet

Specifications of FDG410NZ

Fet Type
MOSFET N-Channel, Metal Oxide
Fet Feature
Logic Level Gate
Rds On (max) @ Id, Vgs
70 mOhm @ 2.2A, 4.5V
Drain To Source Voltage (vdss)
20V
Current - Continuous Drain (id) @ 25° C
2.2A
Vgs(th) (max) @ Id
1V @ 250µA
Gate Charge (qg) @ Vgs
7.2nC @ 4.5V
Input Capacitance (ciss) @ Vds
535pF @ 10V
Power - Max
380mW
Mounting Type
Surface Mount
Package / Case
6-TSSOP, SC-88, SOT-363
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
©2009 Fairchild Semiconductor Corporation
FDG410NZ Rev.B
Notes:
1. R
2. Pulse Test: Pulse Width < 300 µs, Duty cycle < 2.0%.
3: The diode connected between the gate and source serves only as protection against ESD. No gate overvoltage rating is implied.
Electrical Characteristics
Off Characteristics
On Characteristics
Dynamic Characteristics
Switching Characteristics
Drain-Source Diode Characteristics
BV
∆BV
I
I
V
r
g
C
C
C
R
t
t
t
t
Q
Q
Q
I
V
t
Q
DSS
GSS
∆V
d(on)
r
d(off)
f
S
rr
DS(on)
the user's board design.
FS
GS(th)
SD
∆T
∆T
iss
oss
rss
g
g
gs
gd
rr
Symbol
θJA
DSS
GS(th)
DSS
J
J
is determined with the device mounted on a 1 in
Drain to Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current
Gate to Source Leakage Current
Gate to Source Threshold Voltage
Gate to Source Threshold Voltage
Temperature Coefficient
Static Drain to Source On Resistance
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Gate Resistance
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Gate Charge
Gate to Source Charge
Gate to Drain “Miller” Charge
Maximum Continuous Drain-Source Diode Forward Current
Source to Drain Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
Parameter
2
T
pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R
J
= 25 °C unless otherwise noted
a. 300 °C/W when mounted
on a 1 in
2
pad of 2 oz copper.
V
V
V
I
V
f = 1 MHz
V
I
V
V
V
V
V
T
V
V
I
I
I
V
V
D
D
F
D
D
J
DS
DD
GS
GS
GS
GS
GS
GS
GS
GS
DD
GS
DS
GS
= 2.2 A
= 2.2 A, di/dt = 100 A/µs
= 250 µA, referenced to 25 °C
= 250 µA, V
= 250 µA, referenced to 25 °C
= 125 °C
= 4.5 V, V
= 10 V, I
= 4.5 V, R
= 10 V, V
= 0 V, I
= 16 V, V
= V
= 4.5 V, I
= 2.5 V, I
= 1.8 V, I
= 1.5 V, I
= 4.5 V, I
= 5 V, I
= ±8 V, V
2
DS
Test Conditions
, I
S
D
D
D
D
D
D
D
D
= 0.35 A
GS
DD
GS
DS
= 2.2 A
= 250 µA
GEN
GS
= 2.2 A,
= 2.2 A
= 2.0 A
= 1.8 A
= 1.5 A
= 2.2 A,
= 0 V,
= 0 V
= 0 V
= 10 V,
= 0 V
= 6 Ω
(Note 2)
b. 333 °C/W when mounted on a
θJC
minimum pad of 2 oz copper.
is guaranteed by design while R
Min
0.4
20
400
2.8
5.3
2.3
2.3
5.1
0.6
1.0
Typ
0.7
70
45
18
0.6
2.5
50
56
67
83
71
11
11
-3
17
535
0.35
Max
115
100
7.2
±10
1.0
95
70
10
33
10
1.2
θJA
11
70
77
87
20
10
www.fairchildsemi.com
1
is determined by
mV/°C
mV/°C
Units
mΩ
pF
pF
pF
nC
nC
nC
ns
ns
ns
ns
nC
µA
µA
ns
V
S
A
V
V

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