ATMEGA649V-8AUR Atmel, ATMEGA649V-8AUR Datasheet - Page 247
![IC AVR MCU FLASH 64K 1.8V 64TQFP](/photos/12/13/121332/313-64-tqfp_sml.jpg)
ATMEGA649V-8AUR
Manufacturer Part Number
ATMEGA649V-8AUR
Description
IC AVR MCU FLASH 64K 1.8V 64TQFP
Manufacturer
Atmel
Series
AVR® ATmegar
Datasheet
1.ATMEGA329-16AU.pdf
(392 pages)
Specifications of ATMEGA649V-8AUR
Core Processor
AVR
Core Size
8-Bit
Speed
8MHz
Connectivity
SPI, UART/USART, USI
Peripherals
Brown-out Detect/Reset, LCD, POR, PWM, WDT
Number Of I /o
53
Program Memory Size
64KB (32K x 16)
Program Memory Type
FLASH
Eeprom Size
2K x 8
Ram Size
4K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 5.5 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
*
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
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24.4
2552K–AVR–04/11
TAP Controller
Figure 24-2. TAP Controller State Diagram
The TAP controller is a 16-state finite state machine that controls the operation of the Boundary-
scan circuitry, JTAG programming circuitry, or On-chip Debug system. The state transitions
depicted in
transition) at the time of the rising edge at TCK. The initial state after a Power-on Reset is Test-
Logic-Reset.
As a definition in this document, the LSB is shifted in and out first for all Shift Registers.
Assuming Run-Test/Idle is the present state, a typical scenario for using the JTAG interface is:
•
At the TMS input, apply the sequence 1, 1, 0, 0 at the rising edges of TCK to enter the Shift
Instruction Register – Shift-IR state. While in this state, shift the four bits of the JTAG
instructions into the JTAG Instruction Register from the TDI input at the rising edge of TCK.
The TMS input must be held low during input of the 3 LSBs in order to remain in the Shift-IR
state. The MSB of the instruction is shifted in when this state is left by setting TMS high.
While the instruction is shifted in from the TDI pin, the captured IR-state 0x01 is shifted out
on the TDO pin. The JTAG Instruction selects a particular Data Register as path between
TDI and TDO and controls the circuitry surrounding the selected Data Register.
1
0
Figure 24-2
Test-Logic-Reset
Run-Test/Idle
0
depend on the signal present on TMS (shown adjacent to each state
1
1
0
Select-DR Scan
Capture-DR
Update-DR
Pause-DR
Exit1-DR
Exit2-DR
Shift-DR
ATmega329/3290/649/6490
1
0
0
1
0
1
1
0
1
1
0
0
1
0
Select-IR Scan
Capture-IR
Update-IR
Pause-IR
Exit1-IR
Exit2-IR
Shift-IR
1
0
0
1
0
1
1
0
1
1
0
0
247
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