AT91SAM7SE256B-AU Atmel, AT91SAM7SE256B-AU Datasheet - Page 53
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AT91SAM7SE256B-AU
Manufacturer Part Number
AT91SAM7SE256B-AU
Description
IC ARM7 MCU FLASH 256K 128-LQFP
Manufacturer
Atmel
Series
AT91SAMr
Datasheet
1.AT91SAM7SE256-AU.pdf
(673 pages)
Specifications of AT91SAM7SE256B-AU
Core Processor
ARM7
Core Size
16/32-Bit
Speed
55MHz
Connectivity
EBI/EMI, I²C, SPI, SSC, UART/USART, USB
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
88
Program Memory Size
256KB (256K x 8)
Program Memory Type
FLASH
Ram Size
32K x 8
Voltage - Supply (vcc/vdd)
1.65 V ~ 1.95 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
*
Core
ARM7TDMI
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Details
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
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- Download datasheet (11Mb)
12.5.4.1
6222F–ATARM–14-Jan-11
JTAG Boundary-scan Register
IEEE 1149.1 JTAG Boundary Scan is enabled when JTAGSEL is high. The SAMPLE, EXTEST
and BYPASS functions are implemented. In ICE debug mode, the ARM processor responds
with a non-JTAG chip ID that identifies the processor to the ICE system. This is not IEEE 1149.1
JTAG-compliant.
It is not possible to switch directly between JTAG and ICE operations. A chip reset must be per-
formed after JTAGSEL is changed.
A Boundary-scan Descriptor Language (BSDL) file is provided to set up test.
The Boundary-scan Register (BSR) contains 353 bits that correspond to active pins and associ-
ated control signals.
Each AT91SAM7SExx input/output pin corresponds to a 3-bit register in the BSR. The OUTPUT
bit contains data that can be forced on the pad. The INPUT bit facilitates the observability of data
applied to the pad. The CONTROL bit selects the direction of the pad.
For more information, please refer to BDSL files which are available for the SAM7SE Series.
SAM7SE512/256/32 Preliminary
53
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