MCIMX281AVM4B Freescale Semiconductor, MCIMX281AVM4B Datasheet - Page 11

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MCIMX281AVM4B

Manufacturer Part Number
MCIMX281AVM4B
Description
IC MPU I.MX28 1.2 289MAPBGA
Manufacturer
Freescale Semiconductor
Series
i.MX28r
Datasheets

Specifications of MCIMX281AVM4B

Core Processor
ARM9
Core Size
32-Bit
Speed
454MHz
Connectivity
CAN, EBI/EMI, Ethernet, I²C, MMC, SmartCard, SPI, SSI, UART/USART, USB OTG
Peripherals
DMA, I²S, LCD, POR, PWM, WDT
Program Memory Size
128KB (32K x 32)
Program Memory Type
Mask ROM
Ram Size
32K x 32
Voltage - Supply (vcc/vdd)
1.25 V ~ 5.25 V
Data Converters
A/D 17x12b
Oscillator Type
External
Operating Temperature
-40°C ~ 85°C
Package / Case
289-LFBGA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Number Of I /o
-
Eeprom Size
-
Lead Free Status / Rohs Status
Supplier Unconfirmed
1
2
3
3
This section provides the device-level and module-level electrical characteristics for the i.MX28.
3.1
This section provides the device-level electrical characteristics for the IC.
3.1.1
Table 7
Freescale Semiconductor
Battery Pin
5-Volt Source Pin - transient, t<30ms, duty cycle <0.05%
5 Volt Source Pin - static
PSWITCH
Analog Supply Voltage
Digital Core Supply Voltage
Non-EMI Digital I/O Supply
EMI Digital I/O Supply
DC-DC Converter
Input Voltage on Any Digital I/O Pin Relative to Ground
Input Voltage on USB_DP and USB_DN Pins Relative to Ground
Analog I/O absolute maximum ratings (exceptions: XTALI, XTALO,
RTC_XTALI, RTC_XTALO)
Storage Temperature
VDDIO can be applied to PSWITCH through a 10 kΩ resistor. This is necessary in order to enter the chip’s firmware recovery
mode. (The on-chip circuitry prevents the actual voltage on the pin from exceeding acceptable levels.)
Application should include a Schottky diode between BATT and VDD4P2.
USB_DN and USB_DP can tolerate 5V for up to 24 hours. Note that while 5V is applied to USB_DN or USB_DP, LRADC
readings can be corrupted.
Electrical Characteristics
provides the DC absolute maximum operating conditions.
1
i.MX28
DC Absolute Maximum Ratings
2
Stresses beyond those listed under
damage to the device.
Exposure to absolute-maximum-rated conditions for extended periods
may affect device reliability.
Table 6
not implied beyond the conditions indicated in
i.MX28 Applications Processors Data Sheet for Automotive Products, Rev. 0
Device-Level Conditions
Parameter
gives stress ratings only—functional operation of the device is
Table 6. DC Absolute Maximum Ratings
CAUTION
Table 7
3
BATT, V
DCDC_BATT
V
Symbol
may cause permanent
DDIO.EMI
V
V
V
V
V
DD5V
DD5V
DDIO
DDD
DDA
DD4P2V
Table
8.
Min.
–0.3
–0.3
–0.3
–0.3
–0.3
–0.3
–0.3
–0.3
–0.3
–0.3
–0.3
–0.3
–40
VDDIO+0.3
VDDIO+0.3
BATT/2
4.242
1.575
BATT
Max.
7.00
6.00
2.10
3.63
3.63
3.63
125
Units
°
V
V
V
V
V
V
V
V
V
V
V
V
C
11

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