1323XNSK Freescale Semiconductor, 1323XNSK Datasheet - Page 21

KIT DEV FOR 1323X_NETWORK

1323XNSK

Manufacturer Part Number
1323XNSK
Description
KIT DEV FOR 1323X_NETWORK
Manufacturer
Freescale Semiconductor
Type
Transceiver, 802.15.4r
Datasheets

Specifications of 1323XNSK

Frequency
2.4GHz
Interface Type
SPI
For Use With/related Products
MC1323x
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
All latchup test testing is in conformity with the JESD78 IC Latch-Up Test.
A device is defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification.
11.3
Freescale Semiconductor
Power Supply Voltage (V
Input Frequency
Operating Temperature Range
Logic Input Voltage Low
Logic Input Voltage High
Recommended Operating Conditions
1
Parameter is achieved by design characterization on a small sample size from typical devices
under typical conditions unless otherwise noted.
1
No.
Latch-up
Machine
This number represents a minimum number for both positive pulse(s) and negative pulse(s)
1
2
3
4
Human
Model
Body
Characteristic
BATT
Human body model (HBM)
Machine model (MM)
Charge device model (CDM)
Latch-up current at T
)
Series resistance
Storage capacitance
Number of pulses per pin
Series resistance
Storage capacitance
Number of pulses per pin
Minimum input voltage limit
Maximum input voltage limit
Table 5. ESD and Latch-Up Protection Characteristics
Table 6. Recommended Operating Conditions
Table 4. ESD and Latch-up Test Conditions
Rating
MC1323x Advance Information, Rev. 1.2
Description
1
A
= 85°C
1
1
Symbol
V
V
V
I
HBM
CDM
LAT
MM
Symbol
Symbol
V
V
R1
R1
BATT
V
T
f
C
C
in
IH
A
IL
± 2000
± 200
± 500
± 100
Min
V
2.405
70%
1.8
Min
-40
BATT
0
Value
1
1500
– 1.8
100
200
5.4
1
0
1
Max
Typ
2.7
25
-
-
-
Unit
pF
pF
Ω
Ω
V
V
Unit
V
V
2.480
mA
Max
30%
V
V
V
3.6
BATT
BATT
85
Unit
GHz
Vdc
°C
V
V
21

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