MMA1260EG Freescale Semiconductor, MMA1260EG Datasheet - Page 4

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MMA1260EG

Manufacturer Part Number
MMA1260EG
Description
SENSOR ACCEL Z-AXIS 1.5G 16-SOIC
Manufacturer
Freescale Semiconductor
Series
MMAr
Datasheet

Specifications of MMA1260EG

Axis
Z
Acceleration Range
±1.5g
Sensitivity
1200 mV/g
Voltage - Supply
4.75 V ~ 5.25 V
Output Type
Analog
Bandwidth
50Hz
Mounting Type
Surface Mount
Package / Case
16-SOIC (0.300", 7.50mm Width)
Sensing Axis
Z
Acceleration
1.5 g
Supply Voltage (max)
7 V
Supply Voltage (min)
- 0.3 V
Supply Current
2.2 mA
Maximum Operating Temperature
+ 105 C
Minimum Operating Temperature
- 40 C
Mounting Style
SMD/SMT
For Use With
RD1986MMA2260D - KIT SENSOR ACCEL MMA2260D TRIAX
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Interface
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MMA1260EG
Manufacturer:
FREESCALE
Quantity:
20 000
MMA1260KEG
4
integrated-circuit accelerometer.
capacitive sensing cell (g-cell) and a CMOS signal
conditioning ASIC contained in a single integrated circuit
package. The sensing element is sealed hermetically at the
wafer level using a bulk micromachined “cap'' wafer.
semiconductor materials (polysilicon) using semiconductor
processes (masking and etching). It can be modeled as two
stationary plates with a moveable plate in-between. The
center plate can be deflected from its rest position by
subjecting the system to an acceleration
fixed plate will increase by the same amount that the distance
to the other plate decreases. The change in distance is a
measure of acceleration.
(Figure
distance between the plates changes and each capacitor's
value will change, (C = Aε/D). Where A is the area of the
plate, ε is the dielectric constant, and D is the distance
between the plates.
measure the g-cell capacitors and extract the acceleration
data from the difference between the two capacitors. The
ASIC also signal conditions and filters (switched capacitor)
the signal, providing a high level output voltage that is
ratiometric and proportional to acceleration.
The Freescale accelerometer is a surface-micromachined
The device consists of a surface micromachined
The g-cell is a mechanical structure formed from
When the center plate deflects, the distance from it to one
The g-cell plates form two back-to-back capacitors
The CMOS ASIC uses switched capacitor techniques to
Figure 3. Transducer
Physical Model
4). As the center plate moves with acceleration, the
Acceleration
Figure 4. Equivalent
Circuit Model
(Figure
PRINCIPLE OF OPERATION
3).
Filtering
switched capacitor filter. A Bessel implementation is used
because it provides a maximally flat delay response (linear
phase) thus preserving pulse shape integrity. Because the
filter is realized using switched capacitor techniques, there is
no requirement for external passive components (resistors
and capacitors) to set the cut-off frequency.
Self-Test
verification of the mechanical and electrical integrity of the
accelerometer at any time before or after installation. This
feature is critical in applications such as automotive airbag
systems where system integrity must be ensured over the life
of the vehicle. A fourth “plate'' is used in the g-cell as a self-
test plate. When the user applies a logic high input to the self-
test pin, a calibrated potential is applied across the self-test
plate and the moveable plate. The resulting electrostatic
force (Fe =
resultant deflection is measured by the accelerometer's
control ASIC and a proportional output voltage results. This
procedure assures that both the mechanical (g-cell) and
electronic sections of the accelerometer are functioning.
Status
and a fault latch. The Status pin is an output from the fault
latch, OR'd with self-test, and is set high whenever the
following event occurs:
input pin, unless one (or more) of the fault conditions
continues to exist.
The Freescale accelerometers contain an onboard 2-pole
The sensor provides a self-test feature that allows the
Freescale accelerometers include fault detection circuitry
The fault latch can be reset by a rising edge on the self-test
Parity of the EPROM bits becomes odd in number.
1
/
2
AV
2
/d
SPECIAL FEATURES
2
) causes the center plate to deflect. The
Freescale Semiconductor
Sensors

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