2MBI300U4N-120-50 FUJI ELECTRIC, 2MBI300U4N-120-50 Datasheet
2MBI300U4N-120-50
Specifications of 2MBI300U4N-120-50
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2MBI300U4N-120-50 Summary of contents
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... SPECIFICATION Device Name : Type Name : Spec. No. : H.Kaneda Feb. 14 ’06 T.Miyasaka Feb. 14 ’06 M.W atanabe K.Yamada IGBT MODULE (RoHS compliant product) 2MBI300U4N-120-50 MS5F 6509 MS5F6509 H04-004-07b ...
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Classi- Date Ind. fication Enactment Feb. -14 -’06 a Sep. -20 -’07 Revision Revised Outline Drawing (P3/14 Applied Content Drawn date Issued date T.K oga MS5F6509 ...
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... Outline Drawing ( Unit : Equivalent circuit 2MBI300U4N-120-50 (RoHS compliant product) ( OUT OUT ( MS5F6509 T1 T1 [Thermistor (3, H04-004-03a ...
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Absolute Maximum Ratings ( at Tc= 25 Items Collector-Emitter voltage Gate-Emitter voltage Collector current Collector Power Dissipation Junction temperature Storage temperature Isolation between terminal and copper base (*1) between thermistor and others (*2) voltage Screw Mounting (*3) Terminals (*4) ...
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... Indication on module Logo of production 2MBI300U4N-120-50 Lot.No. 8. Applicable category This specification is applied to IGBT-Module named 2MBI300U4N-120-50. 9. Storage and transportation notes • The module should be stored at a standard temperature careful to solderability of the terminals if the module has passed over one year from manufacturing date, under the above storage condition. ...
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... The document (MS5F6209) about RoHS that Fuji Electric Device Technology issued is applied to this IGBT Module. The Japanese Edition(MS5F6212) is made into a reference grade. ...
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Reliability test results Test cate- Test items gories 1 Terminal Strength Pull force (Pull test) Test time 2 Mounting Strength Screw torque Test time 3 Vibration Range of frequency : 10 ~ 500Hz Sweeping time Acceleration Sweeping direction : ...
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Test cate- Test items gories 1 High temperature Reverse Bias Test temp. (for Collector-Emitter) Bias Voltage Bias Method Test duration 2 High temperature Bias (for gate) Test temp. Bias Voltage Bias Method Test duration 3 Temperature Humidity Bias Test temp. ...
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Reliability Test Results Test cate- Test items gories 1 Terminal Strength (Pull test) 2 Mounting Strength 3 Vibration 4 Shock 5 Solderabitlity 6 Resistance to Soldering Heat 1 High Temperature Storage 2 Low Temperature Storage 3 Temperature Humidity Storage 4 ...
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Collector current vs. Collector-Emitter voltage (typ.) o Tj= chip 800 700 VGE=20V 15V 12V 600 500 400 300 200 100 Collector-Emitter voltage : VCE [ V ] Collector current vs. Collector-Emitter voltage (typ.) ...
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Switching time vs. Collector current (typ.) Vcc=600V, VGE=±15V, RG=2.0Ω, Tj=25 10000 1000 toff ton 100 10 0 200 400 Collector current : Switching time vs. Gate resistance (typ.) Vcc=600V, Ic=300A, VGE=±15V, Tj=25 10000 1000 100 tf ...
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Forward current vs. Forward on voltage (typ.) chip 800 700 600 o Tj=25 C Tj=125 500 400 300 200 100 Forward on voltage : Transient thermal resistance (max.) 1.000 0.100 0.010 0.001 ...
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This product shall be used within its absolute maximum rating (voltage, current, and temperature). This product may be broken in case of using beyond the ratings. 製品の絶対最大定格（電圧，電流，温度等）の範囲内で御使用下さい。絶対最大定格を超えて使用すると、素子が破壊する 場合があります。 - Connect adequate fuse or protector of circuit between three-phase line and ...
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... The application examples described in this specification only explain typical ones that used the Fuji Electric Device Technology products. This specification never ensure to enforce the industrial property and other rights, nor license the enforcement rights. 本 ...