2MBI300U4N-120-50 FUJI ELECTRIC, 2MBI300U4N-120-50 Datasheet - Page 8

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2MBI300U4N-120-50

Manufacturer Part Number
2MBI300U4N-120-50
Description
IGBT, 2 PACK MOD, 1200V, 300A, M254
Manufacturer
FUJI ELECTRIC
Datasheet

Specifications of 2MBI300U4N-120-50

Module Configuration
Dual
Transistor Polarity
N Channel
Dc Collector Current
300A
Collector Emitter Voltage Vces
2.05V
Power Dissipation Max
1.385kW
Collector Emitter Voltage V(br)ceo
1.2kV
Transistor Case Style
Module
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
2MBI300U4N-120-50
Manufacturer:
FUJI
Quantity:
1 000
Company:
Part Number:
2MBI300U4N-120-50
Quantity:
350
Test
cate-
gories
1 High temperature
2 High temperature
3 Temperature
4 Intermitted
(for Collector-Emitter)
Humidity Bias
(Power cycle)
( for IGBT )
Reverse Bias
Bias (for gate)
Operating Life
Test items
Electrical
Visual
Note : Each parameter measurement read-outs shall be made after stabilizing the components
characteristic
inspection
Item
at room ambient for 2 hours minimum, 24 hours maximum after removal from the tests.
at room ambient for 2 hours minimum, 24 hours maximum after removal from the tests.
And in case of the wetting tests, for example, moisture resistance tests, each component
And in case of the wetting tests, for example, moisture resistance tests, each component
shall be made wipe or dry completely before the measurement.
shall be made wipe or dry completely before the measurement.
Each parameter measurement read-outs shall be made after stabilizing the components
Leakage current
Gate threshold voltage VGE(th)
Saturation voltage
Forward voltage
Thermal
Isolation voltage
Visual inspection
Test temp.
Bias Voltage
Bias Method
Test duration
Test temp.
Bias Voltage
Bias Method
Test duration
Test temp.
Relative humidity
Bias Voltage
Bias Method
Test duration
ON time
OFF time
Test temp.
Number of cycles
resistance
Peeling
Plating
and the others
Characteristic
IGBT
FWD
Test methods and conditions
Reliability Test Items
: Ta = 125±5 ℃
: VC = 0.8×VCES
: Applied DC voltage to C-E
: 1000hr.
: Ta = 125±5 ℃
: VC = VGE = +20V or -20V
: Applied DC voltage to G-E
: 1000hr.
: 85±2
: 85±5%
: VC = 0.8×VCES
: Applied DC voltage to C-E
: 1000hr.
: 2 sec.
: 18 sec.
:
: 15000 cycles
Failure Criteria
VGE = 0V
VCE = 0V
VGE = 0V
Tj ≦ 150 ℃, Ta=25±5 ℃
VCE(sat)
or
Symbol
±IGES
(Tj ≦ 150 ℃)
(Tj ≦ 150 ℃)
Tj=100±5 deg
ICES
Viso
VF
VGE
VF
-
VCE
o
C
Lower limit Upper limit
LSL×0.8
The visual sample
Broken insulation
Failure criteria
-
-
-
-
-
-
LSL : Lower specified limit.
USL : Upper specified limit.
USL×1.2
USL×1.2
USL×1.2
USL×1.2
USL×1.2
USL×2
USL×2
MS5F6509
Unit
mA
mA
mV
mV
V
V
-
-
A
Reference norms
(Aug.-2001 edition)
Condition code C
EIAJ ED-4701
Test Method 101
Test Method 101
Test Method 102
Test Method 106
Note
Number
sample
H04-004-03a
of
5
5
5
5
8
14
Accept-
ance
number
( 0 : 1 )
( 0 : 1 )
( 0 : 1 )
( 0 : 1 )
a

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