HLMP-QM00-S0000 Avago Technologies US Inc., HLMP-QM00-S0000 Datasheet - Page 2
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HLMP-QM00-S0000
Manufacturer Part Number
HLMP-QM00-S0000
Description
LED, GREEN, 110mW, 690MCD
Manufacturer
Avago Technologies US Inc.
Specifications of HLMP-QM00-S0000
Led Color
Green
Luminous Intensity @ Test
690mcd
Wavelength Typ
525nm
Forward Current @ Test
20mA
Forward Current If Max
30mA
Forward Voltage @ Test
3.7V
Power Dissipation Pd
110mW
Viewing Angle
12°
Color
Green
Millicandela Rating
690mcd
Current - Test
20mA
Wavelength - Dominant
525nm
Wavelength - Peak
523nm
Voltage - Forward (vf) Typ
3.7V
Lens Type
Clear
Lens Style/size
Round, 1.78mm
Package / Case
Axial, Flat Leads
Size / Dimension
2.09mm L x 2.21mm W
Height
2.92mm
Mounting Type
Through Hole
Resistance Tolerance
525nm
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Luminous Flux @ Current - Test
-
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
HLMP-QM00-S0000
Manufacturer:
AVAGO
Quantity:
40 000
Company:
Part Number:
HLMP-QM00-S0000
Manufacturer:
AVAGO
Quantity:
50 000
Table 2. Reliability Predictions (I
Demonstrated Performance
Notes:
1. The point typical MTBF (which represents 60% confidence level) is the total device hours divided by the number of failures. In the case of
2. The 90% Confidence MTBF represents the minimum level of reliability performance which is expected from 90% of all samples. This
3. A failure is any LED which does not emit light or maximum % Iv degradation is more than 50%.
Example of Failure Rate Calculation
Assume a device operating 8 hours/day, 5 days/week. The utilization factor, given 168 hours/week is:
The point failure rate per year (8760 hours) at 25°C ambient temperature is:
Similarly, 90% confidence level failure rate per year at 25°C:
75
55
35
25
Ambient
Temperature (°C)
85
65
45
zero failures, one failure is assumed for this calculation.
confidence interval is based on the statistics of the distribution of failures. The assumed distribution of failures is exponential. This
particular distribution is commonly used in describing useful life failures. Refer to MIL-STD-690B for details on this methodology.
(8 hours/day) x (5 days/week) / (168 hours/week) = 0.25
(0.086% / 1K hours) x (0.25) x (8760 hours/year) = 0.188% per year
(0.197% / 1K hours) x (0.25) x (8760 hours/year) = 0.431% per year
109
99
89
79
69
59
Junction
Temperature (°C)
49
F
= 30 mA) for InGaN devices
Point Typical Performance in
MTBF
18,000
132,000
Time
26.000
38,000
56,000
85,000
210,000
[1]
[1]
(60% Confidence)
1.786
1.180
Failure Rate
(%/1K Hours)
5.436
3.826
2.642
0.760
0.477
Performance in Time
(90% Confidence)
11,000
16,000
MTBF
8000
24,000
37,000
57,000
91,000
[2]
12.517
1.750
1.098
Failure Rate
(%/1K Hours)
8.810
6.082
2.716
4.112
[2]