AD9649BCPZRL7-65 Analog Devices Inc, AD9649BCPZRL7-65 Datasheet - Page 23
![no-image](/images/manufacturer_photos/0/0/57/analog_devices_inc_sml.jpg)
AD9649BCPZRL7-65
Manufacturer Part Number
AD9649BCPZRL7-65
Description
14 Bit 65 Msps ADC
Manufacturer
Analog Devices Inc
Datasheet
1.AD9649BCPZRL7-20.pdf
(32 pages)
Specifications of AD9649BCPZRL7-65
Number Of Bits
14
Sampling Rate (per Second)
65M
Data Interface
Serial, SPI™
Number Of Converters
1
Power Dissipation (max)
87.5mW
Voltage Supply Source
Analog and Digital
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
32-VFQFN, CSP Exposed Pad
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
AD9649BCPZRL7-65
Manufacturer:
AD
Quantity:
3 200
BUILT-IN SELF-TEST (BIST) AND OUTPUT TEST
The AD9649 includes a built-in test feature designed to enable
verification of the integrity of each channel, as well as facilitate
board-level debugging. Also included is a built-in self-test (BIST)
feature that verifies the integrity of the digital datapath of the
AD9649. Various output test options are also provided to place
predictable values on the outputs of the AD9649.
BUILT-IN SELF-TEST (BIST)
The BIST is a thorough test of the digital portion of the selected
AD9649 signal path. Perform the BIST test after a reset to ensure
that the part is in a known state. During the BIST test, data from
an internal pseudorandom noise (PN) source is driven through
the digital datapath of both channels, starting at the ADC block
output. At the datapath output, CRC logic calculates a signature
from the data. The BIST sequence runs for 512 cycles and then
stops. When the BIST sequence is complete, the BIST compares
the signature results with a predetermined value. If the signatures
match, the BIST sets Bit 0 of Register 0x24, signifying that the
test passed. If the BIST test failed, Bit 0 of Register 0x24 is cleared.
The outputs are connected during this test so that the PN sequence
can be observed as it runs. Writing the value 0x05 to Register 0x0E
Rev. 0 | Page 23 of 32
runs the BIST, enabling Bit 0 (BIST enable) of Register 0x0E
and resetting the PN sequence generator, Bit 2 (BIST init) of
Register 0x0E. Upon completion of the BIST, Bit 0 of Register 0x24
is automatically cleared. The PN sequence can be continued from
its last value by writing a 0 in Bit 2 of Register 0x0E. However, if the
PN sequence is not reset, the signature calculation does not equal
the predetermined value at the end of the test. The user must
then rely on verifying the output data.
OUTPUT TEST MODES
The output test options are described in Table 16 at Address 0x0D.
When an output test mode is enabled, the analog section of the
ADC is disconnected from the digital back end blocks and the
test pattern is run through the output formatting block. Some of
the test patterns are subject to output formatting, and some are
not. The PN generators from the PN sequence tests can be reset
by setting Bit 4 or Bit 5 of Register 0x0D. These tests can be per-
formed with or without an analog signal (if present, the analog
signal is ignored), but they do require an encode clock. For more
information, see the AN-877 Application Note, Interfacing to
High Speed ADCs via SPI.
AD9649