FDY2000PZ Fairchild Semiconductor, FDY2000PZ Datasheet
FDY2000PZ
Specifications of FDY2000PZ
Related parts for FDY2000PZ
FDY2000PZ Summary of contents
Page 1
... This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request ...
Page 2
... Change To Results/Discussion for Qual Plan NumberQ20080344 Test: (Autoclave) Lot Device Q20080344AAACLV FDY2000PZ Q20080344BAACLV FDY300NZ Q20080344CAACLV FDY4000CZ Test: (High Temperature Gate Bias) Lot Device Q20080344AAHTGB FDY2000PZ 96-HOURS 0/79 0/79 0/79 168-HOURS 500-HOURS 1000-HOURS 0/79 0/79 Failure Code Failure Code Pg. 2 ...
Page 3
... Lot Device Q20080344AATHBT FDY2000PZ Q20080344BATHBT FDY300NZ Q20080344CATHBT FDY4000CZ Test: -65C, 150C (Temperature Cycle) Lot Device Q20080344AATMCL1 FDY2000PZ Q20080344AATMCL1 FDY2000PZ Q20080344BATMCL1 FDY300NZ Q20080344BATMCL1 FDY300NZ Q20080344CATMCL1 FDY4000CZ Q20080344CATMCL1 FDY4000CZ Product Id Description : All devices packaged with SOT-523F and SOT-563F. Affected FSIDs : 2N7002T FDY100PZ FDY2001PZ ...