4768-K-36 Pomona Electronics, 4768-K-36 Datasheet - Page 87
4768-K-36
Manufacturer Part Number
4768-K-36
Description
TEST LEADS
Manufacturer
Pomona Electronics
Series
Micrograbber®r
Type
Cable Assemblyr
Specifications of 4768-K-36
Insulator Color
Red / Black
Connector Type B
Micrograbber Clip
Connector Type A
Double Banana Plug
Voltage Rating
1000VDC
Lead Length
36"
1st Connector
Micro Hooks (2)
2nd Connector
Banana Plug, Double
Length
36.000" (914.40mm)
Wire Gauge
RG174, 20 AWG
Voltage - Rated
1000WVDC
Color
Black and Red - Black Wires
Temperature Range
122°F (50°C)
Contents
1 Lead
Wire Insulation Material
Poly-Vinyl Chloride (PVC) - Wires
Standard
Banana Plug
Number Of Positions / Contacts
2
Termination Style
Cable
Contact Plating
Gold
Contact Material
Beryllium Copper
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Current Rating
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Test Clip Selection Made Easy
To select the Pomona IC Test Clip specifically designed for your chip,
find the table for your chip type and follow the selection procedure outlined in this section.
Modular contact
housings.
Lock-on jaw design
assures positive locking
under IC housing.
Precision-molded housing
isolates each contact to
prevent shorting.
Attaches to popular JEDEC ICs
in 68-, 84-, 100-, 132-, 164-
and 196-pin sizes.
High-temperature LCP
molded housing.
IC Test Clips and Adapters
Innovative solutions. Pomona Electronics’ IC Test Clips – designed for your
chip. Uniquely designed for testing surface mount devices – easily, securely
and successfully. Low-profile fine-pitch chips, densely populated boards, or ver-
tical boards, POMONA test clips connect you with confidence.
JEDEC QFP
To find your JEDEC QFP test clip, turn to the
JEDEC QFP table on page 88 and reference the
following characteristics of your target chip:
1. Number Of Leads
2. Body Size
PLCC
To find your PLCC Quad Clip
to the PLCC table on page 89 and reference the
following characteristics of your target chip:
1. Number Of Leads
2. Body Size
Pomona
®
JEDEC IC Test Clip Features
®
test adapter, turn
Flex circuitry (Flexible
Interface Network – FIN™)
allows interface connec-
tion/locking action.
Gold-plated contacts;
low insertion force.
Individually cantilevered
contacts conform to
variances in device lead
position.
SSOP/QSOP
To find your SSOP/QSOP test clip, turn to the
SSOP/QSOP table on page 80 and reference the
following characteristics of your target chip:
1. Lead Pitch and Body Size
2. Number Of Leads
3. Locking Feature (see Fig. 1, 2 & 3, page 88)
DIP
To find your DIP test clip, turn to the DIP table on
page 82 and reference the following characteristics
of your target chip:
1. Number Of Leads
2. Test Clip Contact Style
(see Fig. 1 & 2, page 90)
How to Measure or Calculate the Critical
Dimension for Your QFP Test Clip
calipers parallel to the plane of the PCB
Measure Critical Dimension with
Metric QFP
To find your Metric (EIAJ) QFP test clip, turn to
the Metric QFP table on page 89 and reference the
following characteristics of your target device.
1. Number of leads
2. Body size
3. Lead pitch
4. Critical dim. (See below)
SOIC/SOJ
To find your SOIC Clip
SOIC/SOJ table on page 82 and reference the
following characteristics of your target chip:
1. Number Of Leads
2. Confirm Body Width Compatibility
3. For Lower and Top Test Clip Width
(see Fig. 1, 2 & 3, page 90)
www.pomonaelectronics.com
T
®
test clip, turn to the
Critical Dim. C = D - 2 (L - T)
Critical Dimension
D
L
87