4768-K-36 Pomona Electronics, 4768-K-36 Datasheet - Page 88

TEST LEADS

4768-K-36

Manufacturer Part Number
4768-K-36
Description
TEST LEADS
Manufacturer
Pomona Electronics
Series
Micrograbber®r
Type
Cable Assemblyr
Datasheets

Specifications of 4768-K-36

Insulator Color
Red / Black
Connector Type B
Micrograbber Clip
Connector Type A
Double Banana Plug
Voltage Rating
1000VDC
Lead Length
36"
1st Connector
Micro Hooks (2)
2nd Connector
Banana Plug, Double
Length
36.000" (914.40mm)
Wire Gauge
RG174, 20 AWG
Voltage - Rated
1000WVDC
Color
Black and Red - Black Wires
Temperature Range
122°F (50°C)
Contents
1 Lead
Wire Insulation Material
Poly-Vinyl Chloride (PVC) - Wires
Standard
Banana Plug
Number Of Positions / Contacts
2
Termination Style
Cable
Contact Plating
Gold
Contact Material
Beryllium Copper
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Current Rating
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
88
JEDEC PQFP Test Clips
SSOP/QSOP Test Clips
Pomona offers a wide variety of Micro-SMD
Grabber
PQFP devices. See SMD / Micro Format Test
section for complete selection.
www.pomonaelectronics.com
®
Fig. 2
Test Clips for use in testing fine pitch
Fig. 1
Fig. 1
IC Test Clips and Adapters
Fig. 3
Fig. 2
Model#
5969
5969A
5972
5893
5894
Leads Pattern
No.
20
24
48
56
10+10
12+12
24+24
28+28
Lead
Pomona’s JEDEC QFP test clips are designed
to fit on surface-mounted plastic and ceramic
JEDEC chips. Choose from two clip types
designed to give you optimum functionality
and ease of use for testing, troubleshooting
and custom-design evaluation with logic
analyzers and oscilloscopes.
Lead Pitch: 0.025in (0.635mm).
With Pomona’s SSOP and QSOP test clips,
technicians can now access all of the leads
on popular low-profile, fine-pitch SSOP
and QSOP chips. Each clip has 0.025in
(0.635mm) sq. pins at 0.100in x 0.100in
(2.54mm x 2.54mm) spacing to allow
connections with jumpers or Pomona’s
flying leads.
Fig. 1: Clip is located and held with a
cantilevered plastic guide that holds the
ends of the chip under test. Ideal for densely-
populated boards, this clip can attach onto
a chip that is spaced only 0.050 (1.27mm)
away from an adjacent board component.
Model# No. Leads
5713
5777
(7.62mm)
(7.62mm)
(5.3mm)
(5.3mm)
0.21in
0.21in
Body
0.3in
0.3in
Size
100
(19.05mm x 19.05mm) AMD 29205, 386EM, 386SXLP
(0.635mm)
(0.65mm)
(0.65mm)
(0.65mm)
0.026in
0.026in
0.025in
0.025in
Lead
Pitch
0.75in X 0.75in
Body Size
SSOP
SSOP
SSOP
SSOP
Pkg.
Type
Fig. 1: The basic JEDEC QFP test clip is
designed for use on densely-populated
boards where space is at a minimum. Leads
at the top of the clip are 0.022in x 0.012in
(0.56mm x 0.30mm) and are spaced 0.075in
(1.9mm) apart.
Fig. 2: Pomona’s most popular JEDEC QFP
test clip features a large board with 0.025in
(0.635mm) pins at 0.100in x 0.100in
(2.54mm x 2.54mm) spacing for easy con-
nection to logic analyzers and oscilloscopes.
The board is elevated to avoid other board
components near the target chip.
Fig. 2: Clip features spring-loaded fingers to
attach easily and hold firmly onto the ends of
the chip. Clip fingers are opened by finger
pressure on the upper handles. A clearance
of 0.125in (3.17mm) is required at the ends
of the chip under test.
Fig. 3: Clip features spring-loaded contact
housings that clamp onto the side of the chip
body. Gold-plated contacts are individually
cantilevered to maintain positive connections.
User interface provides 0.025 (0.635mm) sq.
pins at 0.10 (2.54mm) centers.
Lead Pitch: 0.025in (0.635mm).
Typical Applications
Intel 80C186EC, 80386SX,
Typical
Applications
TI SN74ABT245, IDT 74FCT244,
Maxim MAX153
IDT 74FCT244TPY, Phillips 80C751,
MAXIM MAX120, MAX153
TI ABT16244, ACT16245
IDT FCT16223, FCT162511
Fig.
Fig.
1
2
1
3
3
1
2