TP750 Tektronix, TP750 Datasheet - Page 10

• Manufacturer Part Number: TP750
• Description: TEST PROBE, RTD TEMPERATURE
• Manufacturer: Tektronix

Specifications of TP750

• Test Probe Type: RTD Temperature
• Test Probe Functions: Temperature
• Accuracy: ± 0.055°C
• Temperature Measuring Range: -200°C To +300°C
• Equipment Type: Temperature Probe
• Color: Black, Red
• Measured Components: Temperature
• For Use With: DMM4050 Digital Multimeter
• Lead Free Status / RoHS Status: na
• Lead Free Status / RoHS Status: na

Data Sheet
Frequency
Characteristic
Gate Time
Measurement
Method
Settling
Considerations
Measurement
Considerations
Input Characteristics
*
*
Continuity
10
Range
100 mV to 750 V*
Characteristic
Continuity Threshold
Test Current
Response Time
Rate
Maximum Reading
Resolution
4
5
Input >100 mV.
Limited to 8 × 10
www.tektronix.com
7
V Hz.
4, 5
Description
131 ms
AC-coupled input using the AC voltage
measurement function
When measuring frequency after a DC offset
voltage change, errors may occur. For the most
accurate measurement, wait up to 1 second to allow
input-blocking RC time constant to settle
To minimize measurement errors, shield inputs
from external noise when measuring low-voltage,
low-frequency signals
Description
20 Ω
1 mA
100 S/s with audible tone
Fast
199.99 Ω
0.01 Ω
20 kHz – 200 kHz
200 kHz – 1 MHz
2 kHz – 20 kHz
20 Hz – 2 kHz
Frequency
23 °C ±5 °C
0.01 + 0.002
0.01 + 0.002
0.01 + 0.002
0.01 + 0.004
90 days
Diode Test
Characteristic
Response Time
Rate
Maximum Reading
Resolution
Uncertainty
23 °C ±5 °C
0.01 + 0.003
0.01 + 0.003
0.01 + 0.003
0.01 + 0.006
Description
100 S/s with audible tone
Fast
1.9999 V
0.1 mV
1 year
Temperature Coefficient/°C
Outside 18 – 28 °C
0.002 + 0.001
0.002 + 0.001
0.002 + 0.001
0.002 + 0.002