FDN342P Fairchild Semiconductor, FDN342P Datasheet - Page 2

• Manufacturer Part Number: FDN342P
• Description: MOSFET P-CH 20V 2A SSOT-3
• Manufacturer: Fairchild Semiconductor
• Series: PowerTrench®r

Specifications of FDN342P

• Fet Type: MOSFET P-Channel, Metal Oxide
• Fet Feature: Logic Level Gate
• Rds On (max) @ Id, Vgs: 80 mOhm @ 2A, 4.5V
• Drain To Source Voltage (vdss): 20V
• Current - Continuous Drain (id) @ 25° C: 2A
• Vgs(th) (max) @ Id: 1.5V @ 250µA
• Gate Charge (qg) @ Vgs: 9nC @ 4.5V
• Input Capacitance (ciss) @ Vds: 635pF @ 10V
• Power - Max: 460mW
• Mounting Type: Surface Mount
• Package / Case: 3-SSOT, SuperSOT-3
• Configuration: Single
• Transistor Polarity: P-Channel
• Resistance Drain-source Rds (on): 0.08 Ohm @ 4.5 V
• Forward Transconductance Gfs (max / Min): 7 S
• Drain-source Breakdown Voltage: 20 V
• Gate-source Breakdown Voltage: +/- 12 V
• Continuous Drain Current: 2 A
• Power Dissipation: 500 mW
• Maximum Operating Temperature: + 150 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: - 55 C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Lot
Q20070335AAACLV
Q20070335ABACLV
Q20070335BAACLV
Q20070335BBACLV
Q20070335CAACLV
Q20070335CBACLV
Test: (High Temperature Reverse Bias) | Conditions: 150C, -16V | Standard: JESD22-A108
Lot
Q20070335AAHTRB
Q20070335ABHTRB
Test: (High Temperature Reverse Bias) | Conditions: 150C, -24V | Standard: JESD22-A108
Lot
Q20070335CAHTRB
Q20070335CBHTRB
Test: (High Temperature Reverse Bias) | Conditions: 150C, 24V | Standard: JESD22-A108
Lot
Q20070335BAHTRB
Q20070335BBHTRB
Test: (Highly Accelerated Stress Test) | Conditions: 85%RH, 130C, -16V | Standard: JESD22-A110
Lot
Q20070335AAHAST1
Q20070335ABHAST1
Test: (Highly Accelerated Stress Test) | Conditions: 85%RH, 130C, -24V | Standard: JESD22-A110
Lot
Q20070335CAHAST1
Q20070335CBHAST1
Test: (Highly Accelerated Stress Test) | Conditions: 85%RH, 130C, 24V | Standard: JESD22-A110
Lot
Q20070335BAHAST1
Q20070335BBHAST1
Test: (Power Cycle) | Conditions: Delta 100C, 2 Min cycle | Standard: MIL-STD-750-1036
Lot
Q20070335AAPRCL
Q20070335ABPRCL
Q20070335BAPRCL
Q20070335BBPRCL
Q20070335CAPRCL
Q20070335CBPRCL
Test: (Precondition) | Conditions: | Standard: JESD22-A113
Lot
Q20070335AAPCNL1A
Q20070335ABPCNL1A
Q20070335BAPCNL1A
Q20070335BBPCNL1A
Q20070335CAPCNL1A
Q20070335CBPCNL1A
Device
FDC640P
FDC655AN
FDC654P
Device
FDC640P
Device
FDC654P
Device
FDC655AN
Device
FDC640P
Device
FDC654P
Device
FDC655AN
Device
FDC640P
FDC655AN
FDC654P
Device
FDC640P
FDC655AN
FDC654P
Setpoint
96-HOURS
96-HOURS
96-HOURS
96-HOURS
96-HOURS
96-HOURS
Setpoint
168-HOURS
500-HOURS
1000-HOURS
168-HOURS
500-HOURS
1000-HOURS
Setpoint
500-HOURS
1000-HOURS
500-HOURS
1000-HOURS
Setpoint
168-HOURS
500-HOURS
1000-HOURS
168-HOURS
500-HOURS
1000-HOURS
Setpoint
96-HOURS
96-HOURS
Setpoint
96-HOURS
96-HOURS
Setpoint
96-HOURS
96-HOURS
Setpoint
5000-CYCLES
10000-CYCLES
5000-CYCLES
10000-CYCLES
5000-CYCLES
10000-CYCLES
5000-CYCLES
10000-CYCLES
5000-CYCLES
10000-CYCLES
5000-CYCLES
10000-CYCLES
Setpoint
Result
0/77
0/77
0/77
0/77
0/77
0/77
Result
0/77
0/77
0/77
0/77
0/77
0/77
Result
0/77
0/77
0/77
0/77
Result
0/77
0/77
0/77
0/77
0/77
0/77
Result
0/77
0/77
Result
0/77
0/77
Result
0/77
0/77
Result
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
Result
0/231
0/231
0/231
0/231
0/231
0/231
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
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