FDN342P Fairchild Semiconductor, FDN342P Datasheet - Page 3

• Manufacturer Part Number: FDN342P
• Description: MOSFET P-CH 20V 2A SSOT-3
• Manufacturer: Fairchild Semiconductor
• Series: PowerTrench®r

Specifications of FDN342P

• Fet Type: MOSFET P-Channel, Metal Oxide
• Fet Feature: Logic Level Gate
• Rds On (max) @ Id, Vgs: 80 mOhm @ 2A, 4.5V
• Drain To Source Voltage (vdss): 20V
• Current - Continuous Drain (id) @ 25° C: 2A
• Vgs(th) (max) @ Id: 1.5V @ 250µA
• Gate Charge (qg) @ Vgs: 9nC @ 4.5V
• Input Capacitance (ciss) @ Vds: 635pF @ 10V
• Power - Max: 460mW
• Mounting Type: Surface Mount
• Package / Case: 3-SSOT, SuperSOT-3
• Configuration: Single
• Transistor Polarity: P-Channel
• Resistance Drain-source Rds (on): 0.08 Ohm @ 4.5 V
• Forward Transconductance Gfs (max / Min): 7 S
• Drain-source Breakdown Voltage: 20 V
• Gate-source Breakdown Voltage: +/- 12 V
• Continuous Drain Current: 2 A
• Power Dissipation: 500 mW
• Maximum Operating Temperature: + 150 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: - 55 C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Test: (Temperature Cycle) | Conditions: -65C, 150C | Standard: JESD22-A104
Lot
Q20070335AATMCL1
Q20070335ABTMCL1
Q20070335BATMCL1
Q20070335BBTMCL1
Q20070335CATMCL1
Q20070335CBTMCL1
Results/Discussion for Qual Plan Number - Q20080485
Test: (High Temperature Reverse Bias) | Conditions: 150C, -16V | Standard: JESD22-A108
Lot
Q20080485AAHTRB
Q20080485CAHTRB
Test: (High Temperature Reverse Bias) | Conditions: 150C, 24V | Standard: JESD22-A108
Lot
Q20080485BAHTRB
Q20080485DAHTRB
Test: (Highly Accelerated Stress Test) | Conditions: 85%RH, 130C, -16V | Standard: JESD22-A110
Lot
Q20080485AAHAST1
Q20080485CAHAST1
Test: (Highly Accelerated Stress Test) | Conditions: 85%RH, 130C, 24V | Standard: JESD22-A110
Lot
Q20080485BAHAST1
Q20080485DAHAST1
Test: (Power Cycle) | Conditions: Delta 100C, 2 Min cycle | Standard: MIL-STD-750-1036
Lot
Q20080485AAPRCL
Q20080485BAPRCL
Q20080485CAPRCL
Test: (Power Cycle) | Conditions: Delta 100CC, 2 Min cycle | Standard: MIL-STD-750-1036
Lot
Q20080485DAPRCL
Test: (Precondition) | Conditions: | Standard: JESD22-A113
Lot
Q20080485AAPCNL1A
Q20080485BAPCNL1A
Q20080485CAPCNL1A
Q20080485DAPCNL1A
Test: (Temperature Cycle) | Conditions: -65C, 150C | Standard: JESD22-A104
Lot
Q20080485AATMCL1
Device
FDC640P
FDC655AN
FDC654P
Device
FDN302P
NDS332P
Device
FDN337N
FDN359BN
Device
FDN302P
NDS332P
Device
FDN337N
FDN359BN
Device
FDN302P
FDN337N
NDS332P
Device
FDN359BN
Device
FDN302P
FDN337N
NDS332P
FDN359BN
Device
FDN302P
Setpoint
100-CYCLES
500-CYCLES
100-CYCLES
500-CYCLES
100-CYCLES
500-CYCLES
100-CYCLES
500-CYCLES
100-CYCLES
500-CYCLES
100-CYCLES
500-CYCLES
Setpoint
168-HOURS
500-HOURS
1000-HOURS
168-HOURS
500-HOURS
1000-HOURS
Setpoint
168-HOURS
500-HOURS
1000-HOURS
168-HOURS
500-HOURS
1000-HOURS
Setpoint
96-HOURS
96-HOURS
Setpoint
96-HOURS
96-HOURS
Setpoint
5000-CYCLES
10000-CYCLES
5000-CYCLES
10000-CYCLES
5000-CYCLES
10000-CYCLES
Setpoint
5000-CYCLES
10000-CYCLES
Setpoint
Setpoint
100-CYCLES
500-CYCLES
Result
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
Result
0/77
0/77
0/77
0/77
0/77
0/77
Result
0/77
0/77
0/77
0/77
0/77
0/77
Result
0/77
0/77
Result
0/77
0/77
Result
0/77
0/77
0/77
0/77
0/77
0/77
Result
0/77
0/77
Result
0/154
0/154
0/154
0/154
Result
0/77
0/77
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
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