5962-8670901XA QP SEMICONDUCTOR, 5962-8670901XA Datasheet - Page 15

• Manufacturer Part Number: 5962-8670901XA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8670901XA

• Lead Free Status / RoHS Status: Not Compliant

DSCC FORM 2234
APR 97
array function must be deleted prior to programming.
(original equipment), design applications, and logistics purposes.
prepared specification or drawing.
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for
coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962)
should contact DSCC-VA, telephone [phone].
[phone].
HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted
by DSCC-VA.
4.3.2 Groups C and D inspections.
4.4 Programming procedures. The programming procedures shall be as specified by the device manufacturer. The test
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus when a system application
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43216-5000, or telephone
6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MIL-
a.
b.
(1)
(2)
(3)
DEFENSE SUPPLY CENTER COLUMBUS
End-point electrical parameters shall be as specified in table II herein.
Steady-state life test conditions, method 1005 of MIL-STD-883.
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified
in test method 1005 of MIL-STD-883.
T
MICROCIRCUIT DRAWING
Test condition A, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
COLUMBUS, OHIO 43216-5000
A
= +125 C, minimum.
STANDARD
SIZE
A
REVISION LEVEL
E
SHEET
5962-86709
15