5962-8953202QA QP SEMICONDUCTOR, 5962-8953202QA Datasheet - Page 27

• Manufacturer Part Number: 5962-8953202QA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8953202QA

• Lead Free Status / RoHS Status: Not Compliant

DSCC FORM 2234
APR 97
appendix A.
prior to quality conformance inspection. The following additional criteria shall apply:
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
b.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
4.3.1 Group A inspection.
a.
a.
b.
c.
d.
(1) Test condition A or D. The test circuit shall be maintained by the manufacturer under document revision level
(2) T
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
DEFENSE SUPPLY CENTER COLUMBUS
Burn-in test, method 1015 of MIL-STD-883.
Tests shall be as specified in table II herein.
Subgroups 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
Subgroup 4 (C
may affect capacitance. A minimum sample size of five devices with zero rejects shall be required.
Subgroups 7 and 8 shall include verification of the instruction set. The instruction set forms a part of the vendors test
tape and shall be maintained and available from the approved sources of supply.
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method
1015 of MIL-STD-883.
A
MICROCIRCUIT DRAWING
= +125°C, minimum.
COLUMBUS, OHIO 43218-3990
STANDARD
IN
measurement) shall be measured only for the initial test and after process or design changes which
* PDA applies to subgroup 1.
Interim electrical parameters
Final electrical test parameters
Group A test requirements
Groups C and D end-point
MIL-STD-883 test requirements
(method 5004)
(method 5004)
(method 5005)
electrical parameters
(method 5005)
TABLE II. Electrical test requirements.
MIL-STD-883, method 5005,
SIZE
A
(in accordance with
1, 2, 3, 4, 7, 8,
1*, 2, 3, 7, 8,
Subgroups
9, 10, 11
9, 10, 11
table I)
1, 2, 3
1
REVISION LEVEL
C
SHEET
5962-89532
27