MC33879APEKR2 Freescale Semiconductor, MC33879APEKR2 Datasheet - Page 12
MC33879APEKR2
Manufacturer Part Number
MC33879APEKR2
Description
CONFIG OCTAL SERIAL SW
Manufacturer
Freescale Semiconductor
Datasheet
1.MC33879APEK.pdf
(23 pages)
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
12
33879
ELECTRICAL CHARACTERISTICS
TYPICAL ELECTRICAL CHARACTERISTICS
NOTE: C
fixture and probe.
SCLK
20
19
18
17
16
15
14
-40
L
V
-25
PWR
represents the total capacitance of the test
Figure 5. Valid Data Delay Time
Figure 8. I
and Valid Time Test Circuit
@ 18 V
T
V
A,
0
33879
Under
DD
Test
Ambient Temperature (
= 5.0 V
PWR
25
33879A
vs. Temperature
33879
50
CS
DO
(Tri-State to Low)
DO
(Tri-State to High)
TYPICAL ELECTRICAL CHARACTERISTICS
Figure 7. Enable and Disable Time Waveforms
0.2 V
75
C
DD
L
DO
100
= 200 pF
t
F(CS)
C
< 50 ns
125
t
t
DO(EN)
DO(EN)
90%
10%
90%
10%
t
R(CS)
90%
SCLK
DO
(Low-to-High)
DO
(High-to-Low)
< 50 ns
0.7 V
7
6
5
4
3
2
1
Figure 9. Sleep State I
-40
t
t
DO(DIS)
DO(DIS)
10%
DD
V
-25
V
3.3/5.0 V
Figure 6. Valid Data Delay Time
V
PWR
0.7 V
Tri-State
Tri-State
and Valid Time Waveforms
0.2 V
0.7 V
@ 13 V
t
0 V
V
R(DI)
V
T
OH
DD
OL
A,
DD
DD
0
Ambient Temperature (
Analog Integrated Circuit Device Data
< 50 ns
25
50%
t
R(DO
PWR
50
Freescale Semiconductor
t
VALID
vs. Temperature
t
0.2
F(DI
0.7 V
75
DD
< 50 ns
100
0.2 V
C
3.3/5.0 V
DD
0 V
V
V
V
V
125
OH
OL
OH
OL