HA1-5320/883 Intersil, HA1-5320/883 Datasheet
HA1-5320/883
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HA1-5320/883 Summary of contents
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... This monolithic device is manufactured using the Intersil Dielectric Isolation Process, minimizing stray capacitance and eliminating SCR’s. This allows higher speed and latch-free operation. For further information, please see Application Note AN538. Ordering Information PART NUMBER HA1-5320/883 Functional Diagram EXT -INPUT 1 2 +INPUT ...
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Absolute Maximum Ratings Voltage Between V+ and V- Terminals . . . . . . . . . . . . . . . . . . . 40V Differential Input Voltage . . . . . . . . ...
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TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS Device Tested at +15V -15V; V Unless Otherwise Specified PARAMETERS SYMBOL Output Voltage Swing + Power Supply Current + Power Supply Rejection +PSRR Ratio ...
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TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS PARAMETER SYMBOL Hold Mode Feedthrough V HMF Hold Step Error V ERROR Sample Mode Noise E N(SAM- Voltage PLE) Hold Mode Noise E N(HOLD) Voltage Input Capacitance C IN Input Resistance R IN Slew Rate ...
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Die Characteristics DIE DIMENSIONS 152 x 19 ± 1mils METALLIZATION: Type: Al Å Å ± 2k Thickness: 16k GLASSIVATION: Type: Nitride ( over Silox (SiO 3 4 Å Å ± 2k Silox Thickness: 12k ...
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Burn-In Circuits - NOTES 100kΩ, 5%, (per socket 0.01µF minimum per socket or 0.1µF minimum per row 1N4002 or equivalent (per board). ...
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Packaging -A- - bbb BASE Q PLANE -C- SEATING PLANE ccc NOTES: 1. Index area: ...
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... TM DESIGN INFORMATION May 2002 The information contained in this section has been developed through characterization by Intersil Semiconductor and is for use as applica- tion and design information only. No guarantee is implied. Applying the HA-5320 The HA-5320 has the uncommitted differential inputs amp, allowing the Sample and Hold function to be combined with many conventional op amp circuits ...
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... DESIGN INFORMATION The information contained in this section has been developed through characterization by Intersil Semiconductor and is for use as applica- tion and design information only. No guarantee is implied. Test Circuits S/H CONTROL INPUT CHARGE TRANSFER TEST 1. Observe the “hold step” voltage S/H CONTROL ...
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... DESIGN INFORMATION The information contained in this section has been developed through characterization by Intersil Semiconductor and is for use as applica- tion and design information only. No guarantee is implied. Performance Curves V SUPPLY TYPICAL SAMPLE AND HOLD PERFORMANCE AS FUNCTION OF HOLDING CAPACITOR 10 ACQUISITION TIME FOR 10V STEP TO +0.01%(µs) ...
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... Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reli- able. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use ...