USBUF02W6 STMicroelectronics, USBUF02W6 Datasheet - Page 6

IC EMI FILTER/LINE TERM SOT323-6

USBUF02W6

Manufacturer Part Number
USBUF02W6
Description
IC EMI FILTER/LINE TERM SOT323-6
Manufacturer
STMicroelectronics
Series
ASDr
Datasheet

Specifications of USBUF02W6

Filter Type
Signal Line
Mounting Type
Surface Mount
Termination Style
Surface Mount (SMD,SMT)
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Inductance
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
497-3743-2

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Technical information
2.4
2.5
6/11
Figure 8.
Please note that the USBUFxxW6 is not only acting for positive ESD surges but also for
negative ones. For these kinds of disturbances it clamps close to ground voltage as
shown in
Latch-up phenomena
The early ageing and destruction of IC’s is often due to latch-up phenomenon which is
mainly induced by dV/dt. Thanks to its structure, the USBUFxxW6 provides a high immunity
to latch-up phenomenon by smoothing very fast edges.
Crosstalk behavior
Figure 9.
The crosstalk phenomenon is due to the coupling between 2 lines. The coupling factor (
or
example above the expected signal on load R
has got an extra value
crosstalk phenomenon of the line 1 on the line 2. This phenomenon has to be taken into
account when the drivers impose fast digital data or high frequency analog signals in the
disturbing line. The perturbed line will be more affected if it works with low voltage signal or
high load impedance (few k ).
21
) increases when the gap across lines decreases, particularly in silicon dice. In the
Figure 8.
V
G1
Remaining voltage at both stages S1 (Vinput) and S2 (Voutput) during
ESD surge
Crosstalk phenomenon.
V
G2
(negative surge.
Positive surge
DRIVERS
R
G1
21
R
V
G2
G1
. This part of the V
Vin
Vout
Line 1
Line 2
L2
is
G1
2
RECEIVERS
signal represents the effect of the
V
R
G2
L2
, in fact the real voltage at this point
Negative surge
R
L1
2
V +
G2
1
V +
2 1
G1
Vout
Vin
V
G1
1 2
USBUFxxW6
V
G2
12

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