5962-8752902LA QP SEMICONDUCTOR, 5962-8752902LA Datasheet - Page 10

• Manufacturer Part Number: 5962-8752902LA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8752902LA

• Organization: 2Kx8
• Interface Type: Parallel
• In System Programmable: In System/External
• Access Time (max): 35ns
• Package Type: CDIP
• Reprogramming Technique: UV
• Operating Supply Voltage (typ): 5V
• Operating Supply Voltage (min): 4.5V
• Operating Supply Voltage (max): 5.5V
• Supply Current: 120mA
• Pin Count: 24
• Mounting: Through Hole
• Operating Temp Range: -55C to 125C
• Operating Temperature Classification: Military
• Lead Free Status / RoHS Status: Not Compliant

DSCC FORM 2234
APR 97
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
4.3.1 Group A inspection.
4.3.2 Groups C and D inspections.
DEFENSE SUPPLY CENTER COLUMBUS
a. Tests shall be as specified in table II herein.
b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
c. All devices selected for testing shall be programmed with a checkerboard pattern, or equivalent. After completion of all
d. Subgroup 4 (C
e. As a minimum, subgroups 7 and 8 shall consist of verifying the EPROM pattern specified.
a. End-point electrical parameters shall be as specified in table II herein.
b. Steady-state life test conditions, method 1005 of MIL-STD-883.
c. All devices submitted for testing shall be programmed with a checkerboard pattern, or equivalent. After completion of
(1) Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level control
(2) T
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883
testing, the devices shall be erased and verified except devices being submitted to groups B, C, and D testing.
changes which may affect capacitance. Sample size is 5 devices with no failures, and all input and output terminals
tested.
all testing, the devices shall be erased and verified.
COLUMBUS, OHIO 43218-3990
and shall be made available to the preparing or procuring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005
of MIL-STD-883.
| MIL-STD-883 test requirements
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| Interim electrical parameters
| (method 5004)
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| Final electrical test parameters
| (method 5004)
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| Group A test requirements
| (method 5005)
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| Groups C and D end-point
| electrical parameters
| (method 5005)
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1/ *
2/ ** See 4.3.1d.
3/ *** See 4.3.1e.
4/
5/
A
MICROCIRCUIT DRAWING
= +125 ° C, minimum.
Any subgroups at the same temperature may be combined using a multifunctional tester.
For all electrical tests, the device shall be programmed to the pattern specified.
PDA applies to subgroups 1, 7, and 9.
STANDARD
IN
and C
OUT
measurements) shall be measured only for the initial test and after process or design
TABLE II. Electrical test requirements. 1/ 2/ 3/ 4/ 5/
| Subgroups (per method
| 5005, table I)
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1, 2, 3, 4**, 7***, 8***, 9, 10, 11
1*, 2, 3, 7*, 8, 9,10,11
SIZE
A
2, 3, 7, 8
- - -
REVISION LEVEL
E
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SHEET
5962-87529
10