MMDOE28G5MPP-0VA Samsung Semiconductor, MMDOE28G5MPP-0VA Datasheet - Page 32

• Manufacturer Part Number: MMDOE28G5MPP-0VA
• Manufacturer: Samsung Semiconductor

Specifications of MMDOE28G5MPP-0VA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

7.3.6 Self-test log structure
The following defines the 512 bytes that make up the Self-test log sector.
Note: N is 0 through 20
The data structure contains the descriptor of the Self-test that the device has performed. Each descriptor is 24 bytes long and the self-test
data structure is capable to contain up to 21 descriptors. After 21 descriptors has been recorded, the oldest descriptor will be overwritten with
the new descriptor. The self-test log pointer points to the most recent descriptor. When there is no descriptor, the value is 0. When there are
descriptor(s), the value is 1 through 21.
7.3.7 Selective self-test log data structure
The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select the parameters for the self-
test and to monitor the progress of the self-test. The following table defines the contents of the Selective self-test log which is 512 bytes long.
All multi-byte fields shown in these data structures follow the specifications for byte ordering.
MMCRE64G5MPP-0VA
0~1
n*24+2
n*24+3
n*24+4~n*24+5
n*24+6
n*24+7~n*24+10
n*24+11~n*24+25
...
506~507
508
509~510
511
0-1
2-9
10-17
18-25
26-33
34-41
42-49
50-57
58-65
66-73
74-81
82-337
338-491
492-499
500-501
502-503
504-507
508-509
510
511
Byte
Byte
Data structure revision
Starting LBA for test span 1
Ending LBA for test span 1
Starting LBA for test span 2
Ending LBA for test span 2
Starting LBA for test span 3
Ending LBA for test span 3
Starting LBA for test span 4
Ending LBA for test span 4+
Starting LBA for test span 5
Ending LBA for test span 5
Reserved
Vendor specific
Current LBA under test
Current span under test
Feature flags
Vendor Specific
Selective self test pending time
Reserved
Data structure checksum
Data structure revision
Self-test number
Self-test execution status
Life timestamp
Self-test failure check point
LBA of first failure
Vendor specific
...
Vendor specific
Self-test log pointer
Reserved
Data structure checksum
Table 7-8: Self-test log data structure
Description
32
Byte
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
Reserved
Vendor specific
Read
Read
R/W
Vendor specific
R/W
Reserved
R/W
Read/Write
Final