5962-8851805LA QP SEMICONDUCTOR, 5962-8851805LA Datasheet - Page 10

• Manufacturer Part Number: 5962-8851805LA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8851805LA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
4.3.1 Group A inspection.
a. Tests shall be as specified in table II herein.
b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
c. Subgroup 4 (C
d. Unprogrammed devices shall be tested for programmability and ac performance compliance to the requirements of Group
e. Subgroups 7 and 8 shall include verification of the truth table.
(1)
(2)
which may affect capacitance. Sample size is fifteen devices with no failures and all input and output terminals tested.
A, subgroups 9, 10, and 11.
DEFENSE SUPPLY CENTER COLUMBUS
Testing the entire lot using additional built-in test circuitry which allows the manufacturer to verify programmability and
ac performance without programming the user array. If this is done, the resulting test patterns shall be verified on all
devices during subgroups 9, 10, and 11, group A testing in accordance with the sampling plan specified in
MIL-STD-883, method 5005.
If such compliance cannot be tested on an unprogrammed device, a sample shall be selected to satisfy
programmability requirements prior to performing subgroups 9, 10, and 11. Twelve devices shall be submitted to
programming (see 3.2.2.2). If more than two devices fail to program, the lot shall be rejected. At the manufacturer's
option, the sample may be increased to 24 total devices with no more than 4 total device failures allowable. Ten
devices from the programmability sample shall be submitted to the requirements of group A, subgroups 9, 10, and 11.
20 total devices with no more than 4 total device failures allowable.
If more than two devices fail, the lot shall be rejected. At the manufacturer's option, the sample may be increased to
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
1/ * Indicates PDA applies to subgroups 1 and 7.
2/ Any or all subgroups may be combined when using high-speed testers.
3/ ** See 4.3.1c.
4/ As a minimum, subgroups 7 and 8 shall consist of verifying the data pattern.
IN
STANDARD
and C
Interim electrical parameters
(method 5004)
Final electrical test parameters
(method 5004)
Group A test requirements
(method 5005)
Groups C and D end-point
electrical parameters (method 5005)
MIL-STD-883 test requirements
OUT
measurement) shall be measured only for the initial test and after process or design changes
TABLE II. Electrical test requirements. 1/ 2/ 3/ 4/
Method 5005, table I)
SIZE
(in accordance with
A
8A, 8B, 9, 10, 11
8A, 8B, 9, 10, 11
1, 2, 3, 4**, 7*,
2, 3, 7, 8A, 8B
1*, 2, 3, 7*,
Subgroups
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REVISION LEVEL
D
SHEET
5962-88518
10