5962-8996702MXA QP SEMICONDUCTOR, 5962-8996702MXA Datasheet - Page 3

• Manufacturer Part Number: 5962-8996702MXA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8996702MXA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
1.3 Absolute maximum ratings. 2/
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
Unless otherwise specified, the issues of these documents are those cited in the solicitation.
(Applications for copies of ASTM publications should be addressed to: ASTM International, PO Box C700, 100 Barr Harbor
Drive, West Conshohocken, PA 19428-2959
2/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
3/ Must withstand the added P D due to short circuit test e.g.; I OS .
1.4 Recommended operating conditions.
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
2.2 Non-Government publications. The following document(s) form a part of this document to the extent specified herein.
AMERICAN SOCIETY FOR TESTING AND MATERIALS (ASTM)
(Copies of these documents are available online at
maximum levels may degrade performance and affect reliability.
Supply voltage range to ground potential (V CC ) ........................-0.5 V dc to +7.0 V dc
DC voltage applied to the outputs in the high Z state.................-0.5 V dc to +7.0 V dc
DC input voltage ........................................................................-3.0 V dc to +7.0 V dc
DC program voltage ...................................................................13.0 V dc
Maximum power dissipation .......................................................1.0 W
Lead temperature (soldering, 10 seconds).................................+260°C
Thermal resistance, junction-to-case (θ JC )................................See MIL-STD-1835
Junction temperature (T J ) ..........................................................+175°C
Storage temperature range (T STG ) ...........................................-65°C to +150°C
Temperature under bias.............................................................-55°C to +125°C
Data retention ............................................................................10 years, (minimum)
Supply voltage range (V CC ) ......................................................+4.5 V dc minimum to +5.5 V dc maximum
Ground voltage (GND) ...............................................................0 V dc
Input high voltage (V IH ) .............................................................2.0 V dc minimum
Input low voltage (V IL ) ...............................................................0.8 V dc maximum
Case operating temperature range (T C ) ....................................-55°C to +125°C
DEPARTMENT OF DEFENSE SPECIFICATION
DEPARTMENT OF DEFENSE STANDARDS
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
MIL-STD-883
MIL-STD-1835 -
MIL-HDBK-103 -
MIL-HDBK-780 -
ASTM Standard F1192-00
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
-
Interface Standard Electronic Component Case Outlines.
Standard Microcircuit Drawings.
Test Method Standard Microcircuits.
List of Standard Microcircuit Drawings.
-
Standard Guide for the Measurement of Single Event Phenomena from
Heavy Ion Irradiation of Semiconductor Devices.
; http://www.astm.org.)
http://assist.daps.dla.mil/quicksearch/
SIZE
A
3/
REVISION LEVEL
or
A
http://assist.daps.dla.mil
SHEET
5962-89967
or from
3