CY7C1470V25-250BZC Cypress Semiconductor Corp, CY7C1470V25-250BZC Datasheet - Page 13

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CY7C1470V25-250BZC

Manufacturer Part Number
CY7C1470V25-250BZC
Description
Manufacturer
Cypress Semiconductor Corp
Datasheet

Specifications of CY7C1470V25-250BZC

Density
72Mb
Access Time (max)
3ns
Sync/async
Synchronous
Architecture
SDR
Clock Freq (max)
250MHz
Operating Supply Voltage (typ)
2.5V
Address Bus
21b
Package Type
FBGA
Operating Temp Range
0C to 70C
Number Of Ports
4
Supply Current
450mA
Operating Supply Voltage (min)
2.375V
Operating Supply Voltage (max)
2.625V
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Pin Count
165
Word Size
36b
Number Of Words
2M
Lead Free Status / RoHS Status
Not Compliant
Document #: 38-05290 Rev. *I
2.5V TAP AC Test Conditions
Input pulse levels ................................................ V
Input rise and fall time..................................................... 1 ns
Input timing reference levels .........................................1.25V
Output reference levels.................................................1.25V
Test load termination supply voltage.............................1.25V
2.5V TAP AC Output Load Equivalent
TAP DC Electrical Characteristics And Operating Conditions
(0°C < T
Identification Register Definitions
V
V
V
V
V
V
I
Revision Number (31:29)
Device Depth (28:24)
Architecture/Memory Type(23:18)
Bus Width/Density(17:12)
Cypress JEDEC ID Code (11:1)
ID Register Presence Indicator (0)
Note:
11. All voltages referenced to V
X
OH1
OH2
OL1
OL2
IH
IL
Parameter
TDO
A
Instruction Field
< +70°C; V
Z = 50Ω
Output HIGH Voltage
Output HIGH Voltage
Output LOW Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input Load Current
DD
O
= 2.5V ±0.125V unless otherwise noted)
SS
Description
(GND).
1.25V
CY7C1470V25
00000110100
(2M x 36)
001000
100100
01011
20pF
000
50Ω
I
I
I
I
GND ≤ V
1
OH
OH
OL
OL
= 1.0 mA
= 100 µA
= –1.0 mA
= –100 µA
SS
to 2.5V
I
≤ V
CY7C1472V25
00000110100
DDQ
Test Conditions
(4M x 18)
001000
010100
01011
000
1
[11]
1.8V TAP AC Test Conditions
Input pulse levels..................................... 0.2V to V
Input rise and fall time .....................................................1 ns
Input timing reference levels........................................... 0.9V
Output reference levels .................................................. 0.9V
Test load termination supply voltage .............................. 0.9V
1.8V TAP AC Output Load Equivalent
V
V
V
V
V
V
V
V
V
V
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
TDO
= 2.5V
= 2.5V
= 1.8V
= 2.5V
= 2.5V
= 1.8V
= 2.5V
= 1.8V
= 2.5V
= 1.8V
CY7C1474V25
00000110100
(1M x 72)
001000
110100
01011
000
1
Z = 50Ω
O
Describes the version number
Reserved for internal use
Defines memory type and archi-
tecture
Defines width and density
Allows unique identification of
SRAM vendor
Indicates the presence of an ID
register
Min.
1.26
–0.3
–0.3
1.7
2.1
1.6
1.7
–5
CY7C1470V25
CY7C1472V25
CY7C1474V25
Description
V
V
DD
DD
0.9V
Max.
0.36
0.4
0.2
0.2
0.7
5
+ 0.3
+ 0.3
20pF
50Ω
Page 13 of 28
DDQ
Unit
µA
V
V
V
V
V
V
V
V
V
V
– 0.2
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