PPC440EP-3BC400C Applied Micro Circuits Corporation, PPC440EP-3BC400C Datasheet - Page 59

• Manufacturer Part Number: PPC440EP-3BC400C
• Manufacturer: Applied Micro Circuits Corporation

Specifications of PPC440EP-3BC400C

• Family Name: 440EP
• Device Core: PowerPC
• Device Core Size: 16b
• Frequency (max): 400MHz
• Instruction Set Architecture: RISC
• Supply Voltage 1 (typ): 1.5/2.5V
• Operating Supply Voltage (max): 1.6/2.7V
• Operating Supply Voltage (min): 1.4/2.3V
• Operating Temp Range: -40C to 90C
• Operating Temperature Classification: Industrial
• Mounting: Surface Mount
• Pin Count: 456
• Lead Free Status / RoHS Status: Not Compliant

Table 8. Signal Functional Description (Sheet 8 of 9)
Notes:
1. Receiver input has hysteresis
2. Must pull up (recommended value is 3kΩ to 3.3V)
3. Must pull down (recommended value is 1kΩ)
4. If not used, must pull up (recommended value is 3kΩ to 3.3V)
5. If not used, must pull down (recommended value is 1kΩ)
6. Strapping input during reset; pull-up or pull-down required
AMCC Proprietary
440EP – PPC440EP Embedded Processor
System Interface
SysClk
SysErr
SysReset
Halt
TmrClk
GPIO00:63
TestEn
RcvrInh
ModeCtrl
LeakTest
RefEn
DrvrInh1
DrvrInh2
PSROOut
Signal Name
Main system clock input.
Set to 1 when a machine check is generated.
Main system reset. External logic can drive this bidirectional pin
low (minimum of 16 cycles) to initiate a system reset. A system
reset can also be initiated by software. Implemented as an open-
drain output (two states; 0 or open circuit).
Halt from external debugger.
Processor timer external input clock.
General purpose I/O 0 through 63. To access these functions,
software must set DCR register bits.
Test Enable.
Receiver Inhibit. Active only when TestEn is active. Used for
manufacturing test only.
Mode Control. Active only when TestEn is active. Used for
manufacturing test only.
Leakage Test. Active only when TestEn is active. Used for
manufacturing test only.
Reference Enable. Active only when TestEn is active. Used for
manufacturing test only.
Driver Inhibit. Active only when TestEn is active. Used for
manufacturing test only.
Driver Inhibit. Active only when TestEn is active. Used for
manufacturing test only.
Module characterization and screening. Use for test purposes only.
Tie down as specified in Note 3 for normal operation.
Description
Revision 1.29 – May 07, 2008
Clock
I/O
I/O
I/O
O
O
I
I
I
I
I
I
I
I
I
Data Sheet
3.3V tolerant
3.3V tolerant
3.3V tolerant
3.3V tolerant
3.3V tolerant
2.5V CMOS
2.5V CMOS
2.5V CMOS
3.3V LVTTL
2.5V CMOS
3.3V LVTTL
2.5V CMOS
3.3V LVTTL
Perf screen
Multiplex
Multiplex
Multiplex
Multiplex
Multiplex
ring osc
Type
Notes
1, 2
1, 2
1, 3
3
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