IDT82V3001APV IDT, Integrated Device Technology Inc, IDT82V3001APV Datasheet - Page 19

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IDT82V3001APV

Manufacturer Part Number
IDT82V3001APV
Description
Manufacturer
IDT, Integrated Device Technology Inc
Datasheet

Specifications of IDT82V3001APV

Function
Wan PLL
Operating Temperature (max)
85C
Operating Temperature (min)
-40C
Package Type
SSOP
Pin Count
56
Mounting
Surface Mount
Lead Free Status / RoHS Status
Not Compliant

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5
Table - 4 Absolute Maximum Ratings
Note:
Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device
at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods
may affect reliability.
Table - 5 Recommended DC Operating Conditions
Table - 6 DC Electrical Characteristics
TEST SPECIFICATIONS
Power Supply Voltage
Voltage on Any Pin with Respect to Ground
Package Power Dissipation
Storage Temperature
Operating Temperature
Power Supply Voltage
Parameter
IDT82V3001A
V
I
V
V
V
V
V
DDS
I
I
DD
CIH
CIL
TIH
TIL
OH
IL
OL
Supply current with OSCi = 0 V
Supply current with OSCi = Clock
CMOS high-level input voltage
CMOS low-level input voltage
TTL high-level input voltage
TTL low-level input voltage
Input leakage current:
High-level output voltage
Low-level output voltage
TEST SPECIFICATIONS
Normal (low level)
Normal (high level)
Pull up (low level)
Pull up (high level)
Pull down (low level)
Pull down (high level)
Parameter
Description
Rating
**
**
**
0.7V
-100
Min
-15
-15
-15
-15
2.0
2.4
0
DDD
Min.
-40
3.0
Typ.
19
0.3V
Max
100
0.8
0.4
10
60
15
15
15
15
0
Min.
DDD
-0.5
-0.5
-55
Typ.
Units
mA
mA
µA
WAN PLL WITH SINGLE REFERENCE INPUT
V
V
V
V
V
V
Outputs unloaded
Outputs unloaded
OSCi, Fref
OSCi, Fref
All input pins except for OSCi and Fref
All input pins except for OSCi and Fref
V
I
I
OH
OL
I
= V
= 8 mA
= 8 mA
V
DDD
DDD
Max.
200
125
5.0
or 0 V
+ 0.5
Max.
+85
3.6
Test Conditions
October 15, 2008
Unit
mW
°C
Unit
V
V
°C
V

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