54FCT521LMQB. National Semiconductor, 54FCT521LMQB. Datasheet - Page 11

• Manufacturer Part Number: 54FCT521LMQB.
• Manufacturer: National Semiconductor

Specifications of 54FCT521LMQB.

• Lead Free Status / RoHS Status: Not Compliant

DSCC FORM 2234
APR 97
(original equipment), design applications, and logistics purposes.
prepared specification or drawing.
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be
used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC
5962) should contact DSCC-VA, telephone [phone].
[phone].
MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and
accepted by DSCC-VA.
4.3.2 Groups C and D inspections.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
6.4 Record of users. Military and industrial users should inform Defense Supply Center Columbus (DSCC) when a system
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or telephone
6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in
a.
b.
(1)
(2)
(3)
DEFENSE SUPPLY CENTER COLUMBUS
End-point electrical parameters shall be as specified in table II herein.
Steady-state life test conditions, method 1005 of MIL-STD-883.
MICROCIRCUIT DRAWING
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1005 of MIL-STD-883.
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
COLUMBUS, OHIO 43218-3990
A
= +125C, minimum.
STANDARD
SIZE
A
REVISION LEVEL
D
SHEET
5962-88543
11