M38510/01205BEA E2V, M38510/01205BEA Datasheet - Page 10

• Manufacturer Part Number: M38510/01205BEA
• Manufacturer: E2V

Specifications of M38510/01205BEA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

as modified in the device manufacturer’s Quality Management (QM) plan. The modification in the QM plan shall not
effect the form, fit, or function as function as described herein.
to qualification and quality conformance inspection. The following additional criteria shall apply:
4. VERIFICATION.
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.
a.
b.
c.
The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified
in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be
maintained under document control by the device manufacturer's Technology Review Board (TRB) in
accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon
request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in
accordance with the intent specified in test method 1015 of MIL-STD-883.
Interim and final electrical test parameters shall be as specified in table II, except interim electrical
parameters test prior to burn-in is optional at the discretion of the manufacturer.
Additional screening for space level product shall be as specified in MIL-PRF-38535.
*PDA applies to subgroup 1.
Interim electrical parameters
Final electrical test parameters
Group A test requirements
Group B electrical test parameters when
using the method 5005 QCI option
Group C end-point electrical
Group D end-point electrical
parameters
parameters
test requirements
MIL-PRF-38535
TABLE II. Electrical test requirements.
10
1
1*, 2, 3,
7, 9, 10, 11
1, 2, 3, 7, 8,
9, 10, 11
1,2,3,
9,10,11
1,2,3,
9,10,11
1, 2, 3
Class S
devices
Subgroups (see table III)
1
1*, 2, 3,
7, 9
1, 2, 3, 7,
8, 9, 10, 11
1, 2, 3
1, 2, 3
Class B
devices
N/A