5962-89689012A QP SEMICONDUCTOR, 5962-89689012A Datasheet - Page 8

• Manufacturer Part Number: 5962-89689012A
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-89689012A

• Logical Function: Mux
• Configuration: 4 x 2:1
• Number Of Inputs: 8
• Number Of Outputs: 4
• Operating Supply Voltage (typ): 5V
• Operating Supply Voltage (min): 4.5V
• Operating Supply Voltage (max): 5.5V
• Power Dissipation: 500mW
• Operating Temp Range: -55C to 125C
• Operating Temperature Classification: Military
• Mounting: Surface Mount
• Pin Count: 20
• Package Type: CLLCC
• Lead Free Status / RoHS Status: Not Compliant

DSCC FORM 2234
APR 97
3/
1/
2/
Functional tests
Propagation delay
Propagation delay
Output enable
Output disable
3014
time, In to Zn
3003
time, S to Zn
3003
time, OE to Zn
3003
time, OE to Zn
3003
test method 1/
MIL-STD-883
For tests not listed in the referenced MIL-STD-883, (e.g. I
RHA devices supplied to this drawing have been characterized through all levels M, D, P, L and R of irradiation.
However, these devices are only tested at the "R" level. Pre and post irradiation values are identical unless otherwise
specified in table I. When performing post irradiation electrical measurements for any RHA level, T
listed herein.
Each input/output, as applicable, shall be tested at the specified temperature, for the specified limits, to the tests in table I
herein. Output terminals not designated shall be high level logic, low level logic, or open, except as follows:
Test and
DEFENSE SUPPLY CENTER COLUMBUS
a. V
b. V
c. For I
placed in the circuit such that all current flows through the meter.
MICROCIRCUIT DRAWING
IC
IC
COLUMBUS, OHIO 43218-3990
(pos) tests, the GND terminal can be open. T
(neg) tests, the V
CC
and I
STANDARD
Symbol
CC
t
t
t
t
t
t
11/
PHL1
12/
PLH1
12/
PHL2
12/
PLH2
12/
12/
t
12/
12/
t
12/
PZH
PHZ
PZL
PLZ
tests, the output terminal shall be open. When performing these tests, the current meter shall be
CC
TABLE I. Electrical performance characteristics - Continued.
See 4.4.1b
V
Verify output V
C
R
See figure 4
C
R
See figure 4
C
R
See figure 4
C
R
See figure 4
C
R
See figure 4
terminal shall be open. T
IN
L
L
L
L
L
L
L
L
L
L
unless otherwise specified
= 50 pF minimum
= 500
= 50 pF minimum
= 500
= 50 pF minimum
= 500
= 50 pF minimum
= 500
= 50 pF minimum
= 500
= V
+4.5 V  V
Test conditions 2/ 3/
-55C  T
IH
or V
IL
C
OUT
CC
 +125C
 +5.5 V
C
C
= +25C.
= +25C.
CC
), utilize the general test procedure under the conditions
type 4/
Device
device
SIZE
class
A
and
All
All
01
All
02
All
01
All
02
All
All
All
All
All
All
All
All
All
All
All
01
All
02
All
4.5 V
5.5 V
4.5 V
4.5 V
4.5 V
4.5 V
4.5 V
4.5 V
4.5 V
4.5 V
4.5 V
4.5 V
4.5 V
V
REVISION LEVEL
CC
subgroups
Group A
10, 11
10, 11
10, 11
10, 11
10, 11
10, 11
10, 11
10, 11
10, 11
10, 11
10, 11
7, 8
7, 8
D
9
9
9
9
9
9
9
9
9
9
9
Min
A
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
L
L
= +25C.
Limits 5/
SHEET
5962-89689
11.5
11.0
10.5
10.0
Max
7.5
9.5
8.0
9.0
7.0
8.0
8.0
9.0
9.5
9.0
8.0
9.5
8.0
9.5
9.0
8.0
9.5
9.0
H
H
8
Unit
ns
ns
ns
ns
ns