MT47H128M16HG-37E:A Micron Technology Inc, MT47H128M16HG-37E:A Datasheet - Page 30

MT47H128M16HG-37E:A

Manufacturer Part Number
MT47H128M16HG-37E:A
Description
Manufacturer
Micron Technology Inc
Type
DDR2 SDRAMr
Datasheet

Specifications of MT47H128M16HG-37E:A

Organization
128Mx16
Address Bus
17b
Access Time (max)
500ps
Maximum Clock Rate
533MHz
Operating Supply Voltage (typ)
1.8V
Package Type
FBGA
Operating Temp Range
0C to 70C
Operating Supply Voltage (max)
1.9V
Operating Supply Voltage (min)
1.7V
Supply Current
195mA
Pin Count
84
Mounting
Surface Mount
Operating Temperature Classification
Commercial
Lead Free Status / RoHS Status
Compliant
Table 10: DDR2 I
Notes 1–7 apply to the entire table
PDF: 09005aef824f87b6
2gbddr2.pdf – Rev. F 12/10 EN
Parameter/Condition
Burst refresh current:
mand at every
HIGH between valid commands; Other control and ad-
dress bus inputs are switching; Data bus inputs are
switching
Self refresh current: CK and CK# at 0V; CKE ≤ 0.2V;
Other control and address bus inputs are floating; Data
bus inputs are floating
Operating bank interleave read current: All bank
interleaving reads, I
=
(I
CS# is HIGH between valid commands; Address bus in-
puts are stable during deselects; Data bus inputs are
switching (see Table 9 (page 28) for details)
DD
t
RCD (I
),
t
RRD =
DD
) - 1 x
t
RRD (I
t
RFC (I
t
CK (I
DD
DD
OUT
DD
Notes:
),
DD
Specifications and Conditions (Die Revision A) (Continued)
) interval; CKE is HIGH, CS# is
= 0mA; BL = 4, CL = CL (I
t
RCD =
t
);
CK =
t
CK =
t
1. I
2. V
3. I
4. Data bus consists of DQ, DM, DQS, DQS#, RDQS, RDQS#, LDQS, LDQS#, UDQS, and
5. Definitions for I
6. I
7. The following I
CK (I
t
RCD (I
t
CK (I
UDQS#. I
operated outside of the range 0°C ≤ T
LOW
HIGH
Stable
Floating
Switching Inputs changing between HIGH and LOW every other clock cycle (once per
Switching Inputs changing between HIGH and LOW every other data transfer (once
When
T
When
T
DD
DD
DD1
DD
C
C
DD
≤ 0°C
specifications are tested after the device is properly initialized. 0°C ≤ T
parameters are specified with ODT disabled.
, I
DD
DD
≥ 85°C
); refresh com-
= +1.8V ±0.1V, V
DD4R
),
); CKE is HIGH,
t
RC =
DD
, and I
values must be met with all combinations of EMR bits 10 and 11.
V
V
Inputs stable at a HIGH or LOW level
Inputs at V
two clocks) for address and control signals
per clock) for DQ signals, not including masks or strobes
t
DD
IN
IN
RC
DD
DD
DD7
), AL
≤ V
≥ V
values must be derated (I
conditions:
IL(AC)max
IH(AC)min
require A12 in EMR1 to be enabled during testing.
DDQ
Symbol
REF
I
= +1.8V ±0.1V, V
I
I
I
DD6L
I
must be derated by 2%; and I
7%.
I
must be derated by 2%; I
slow must be derated by 30%; and I
80% (I
refresh option is still enabled).
30
DD5
DD6
DD7
DD2P
DD0
= V
Electrical Specifications – I
, I
DDQ
and I
DD1
DD6
/2
Configuration
, I
DD3P(SLOW)
will increase by this amount if T
Micron Technology, Inc. reserves the right to change products or specifications without notice.
DD2N
x4, x8, x16
C
x4, x8
x4, x8
≤ 85°C:
x16
x16
, I
DDL
DD2Q
DD
2Gb: x4, x8, x16 DDR2 SDRAM
= +1.8V ±0.1V, V
limits increase) on IT-option devices when
must be derated by 4%; I
, I
DD3N
DD2P
300
300
390
445
-25
, I
12
8
DD3P(FAST)
DD6
must be derated by 20%; I
-3E/-3 -37E
and I
280
280
340
395
12
© 2006 Micron Technology, Inc. All rights reserved.
8
DD6
REF
, I
DD7
= V
must be derated by
DD4R
260
260
295
355
DD
C
must be derated by
12
DDQ
8
< 85°C and the 2x
, I
DD4R
DD4W
Parameters
/2.
C
250
250
295
355
-5E
12
≤ +85°C.
8
and I
, and I
DD5W
Units
DD3P
DD5W
mA
mA
mA

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