MPC9653AACR2/W IDT, Integrated Device Technology Inc, MPC9653AACR2/W Datasheet - Page 9

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MPC9653AACR2/W

Manufacturer Part Number
MPC9653AACR2/W
Description
IC PLL CLK GEN 1:8 3.3V 32-LQFP
Manufacturer
IDT, Integrated Device Technology Inc
Type
PLL Clock Generatorr
Datasheet

Specifications of MPC9653AACR2/W

Pll
Yes with Bypass
Input
LVPECL
Output
LVCMOS
Number Of Circuits
1
Ratio - Input:output
1:8
Differential - Input:output
Yes/No
Frequency - Max
125MHz
Divider/multiplier
Yes/No
Voltage - Supply
3.135 V ~ 3.465 V
Operating Temperature
0°C ~ 70°C
Mounting Type
Surface Mount
Package / Case
32-LQFP
Frequency-max
125MHz
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MPC9653AACR2/W
Manufacturer:
IDT, Integrated Device Technology Inc
Quantity:
10 000
IDT™ 3.3 V 1:8 LVCMOS PLL Clock Generator
Freescale Timing Solutions Organization has been acquired by Integrated Device Technology, Inc
MPC9653A
3.3 V 1:8 LVCMOS PLL Clock Generator
FREESCALE SEMICONDUCTOR ADVANCED CLOCK DRIVERS DEVICE DATA
The variation in cycle time of a signal between adjacent cycles,
over a random sample of adjacent cycle pairs
The pin-to-pin skew is defined as the worst case difference
in propagation delay between any similar delay path within a
single device
The time from the PLL controlled edge to the non controlled
edge, divided by the time between PLL controlled edges,
expressed as a percentage
Figure 10. Output-to-Output Skew t
Figure 16. Output Transition Time Test
t
F
Figure 12. Output Duty Cycle (DC)
Figure 14. Cycle-to-Cycle Jitter
t
T
P
N
Reference
T
T
0
N+1
DC = t
t
SK(O)
P
/T
0
T
x 100%
JIT(CC)
t
R
V
= |T
CC
0.55
N
= 3.3 V
2.4
SK(O)
–T
N+1
V
V
GND
CC
CC
V
V
GND
V
V
GND
|
CC
CC
CC
CC
÷ 2
÷ 2
÷ 2
9
PCLK
PCLK
FB_IN
The deviation in t
mean in a random sample of cycles
The deviation in cycle time of a signal with respect to the ideal
period over a random sample of cycles
Figure 11. Propagation delay (t
PCLK
PCLK
Ext_FB
T
0
0
Figure 15. Period Jitter
offset) Test Reference
for a controlled edge with respect to a T
Figure 13. I/O Jitter
t
(PD)
V
PP
T
T
= 0.8 V
JIT(∅)
JIT(PER)
(PD)
= |T
, static phase
= |T
0
–T
N
MPC9653A
–1/f
1
mean|
0
|
V
V
V
V
GND
CC
CC
CMR =
CC
NETCOM
0
–1.3 V
÷ 2
MPC9653A
537

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