AD7628KRZ Analog Devices Inc, AD7628KRZ Datasheet - Page 3

IC DAC 8BIT DUAL W/BUFF 20-SOIC

AD7628KRZ

Manufacturer Part Number
AD7628KRZ
Description
IC DAC 8BIT DUAL W/BUFF 20-SOIC
Manufacturer
Analog Devices Inc
Datasheet

Specifications of AD7628KRZ

Settling Time
400ns
Number Of Bits
8
Number Of Converters
2
Voltage Supply Source
Single Supply
Power Dissipation (max)
450mW
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
20-SOIC (7.5mm Width)
Resolution (bits)
8bit
Input Channel Type
Parallel
Data Interface
Parallel
Supply Voltage Range - Analogue
10.8V To 15.75V
Supply Current
2mA
Digital Ic Case Style
SOIC
No. Of Pins
20
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AD7628KRZ
Manufacturer:
ADI
Quantity:
362
ABSOLUTE MAXIMUM RATINGS
(T
V
V
AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . . V
DGND to AGND . . . . . . . . . . . . . . . . . . . . . . . . V
Digital Input Voltage to DGND . . . . . . –0.3 V, V
V
V
V
Power Dissipation (Any Package) to +75 C . . . . . . . . 450 mW
Operating Temperature Range
Storage Temperature . . . . . . . . . . . . . . . . . –65 C to +150 C
Lead Temperature (Soldering, 10 sec) . . . . . . . . . . . . +300 C
Model
AD7628KN –40 C to +85 C
AD7628KP
AD7628KR –40 C to +85 C
AD7628BQ
AD7628TQ –55 C to +125 C
AD7628TE
NOTES
1
2
REV. A
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD7628 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
To order MIL-STD-883, Class B process parts, add /883B to part number.
E = Leadless Ceramic Chip Carrier; N = Plastic DIP; P = Plastic Leaded Chip
Contact your local sales office for military data sheet.
Carrier; Q = Cerdip; R = SOIC.
DD
DD
PIN2
REF
RFB
A
Derates above +75 C by . . . . . . . . . . . . . . . . . . . 6 mW/ C
Commercial (K) Grades . . . . . . . . . . . . . . . –40 C to +85 C
Industrial (B) Grades . . . . . . . . . . . . . . . . . –40 C to +85 C
Extended (T) Grades . . . . . . . . . . . . . . . . –55 C to +125 C
= +25 C unless otherwise noted)
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V, +17 V
to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V, +17 V
, V
A, V
A, V
DAC A/DAC B
1
(MSB) DB7
PIN20
REF
RFB
V
OUT A
RFB A
AGND
DGND
REF
DB6
DB5
DB4
to AGND . . . . . . . . . . . . . . –0.3 V, V
B to AGND . . . . . . . . . . . . . . . . . . . . . . . 25 V
B to AGND . . . . . . . . . . . . . . . . . . . . . . . 25 V
Temperature
Range
–40 C to +85 C
–40 C to +85 C
–55 C to +125 C
A
10
1
2
3
4
5
6
7
8
9
DIP, SOIC
(Not to Scale)
AD7628
TOP VIEW
ORDERING GUIDE
20
19
17
16
15
18
14
13
12
11
Relative
Accuracy Error
1/2 LSB
1/2 LSB
1/2 LSB
1/2 LSB
1/2 LSB
1/2 LSB
OUT B
RFB B
V
V
WR
CS
DB0 (LSB)
DB1
DB2
DB3
REF
DD
B
Gain
DAC A /DAC B
2 LSB
2 LSB
2 LSB
2 LSB
2 LSB
2 LSB
DB7 (MSB)
V
DGND
REF
DB6
DD
DD
DD
DD
PIN CONFIGURATIONS
A
Package
Option
N-20
P-20A
R-20
Q-20
Q-20
E-20A
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
4
5
6
7
8
3
9
2
(Not to Scale)
LCCC
TOP VIEW
AD7628
10
2
–3–
11
1
TERMINOLOGY
Relative Accuracy:
Relative accuracy or endpoint nonlinearity is a measure of the
maximum deviation from a straight line passing through the
endpoints of the DAC transfer function. It is measured after ad-
justing for zero and full-scale, and is normally expressed in
LSBs or as a percentage of full-scale reading.
Differential Nonlinearity:
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of 1 LSB max over
the operating temperature range ensures monotonicity.
Gain Error:
Gain error is a measure of the output error between an ideal
DAC and the actual device output. It is measured with all 1s in
the DAC latches after offset error has been adjusted out. Gain
error of both DACs is adjustable to zero with external resistance.
Output Capacitance:
Capacitance from OUT A or OUT B to AGND.
Digital-to-Analog Glitch Impulse:
The amount of charge injected from the digital inputs to the
analog output when the inputs change state. This is normally
specified as the area of the glitch in either pA-secs or nV-secs,
depending upon whether the glitch is measured as a current or
voltage signal. Glitch impulse is measured with V
= AGND.
Channel-to-Channel Isolation:
The proportion of input signal from one DAC’s reference input
that appears at the output of the other DAC, expressed as a
ratio in dB.
Digital Crosstalk:
The glitch energy transferred to the output of one converter due
to a change in digital input code to the other converter. Speci-
fied in nV secs.
20
12 13
19
18
17
16
15
14
V
V
WR
CS
DB0 (LSB)
REF
DD
B
DAC A/DAC B
DB7 (MSB)
V
DGND
REF
DB6
A
4
5
6
7
8
WARNING!
3
9
PLCC
(Not to Scale)
10
AD7628
TOP VIEW
2
11
1
20
12 13
ESD SENSITIVE DEVICE
19
AD7628
REF
18
17
16
15
14
A, V
V
V
WR
CS
DB0 (LSB)
REF
DD
REF
B
B

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