LMX1600EVAL National Semiconductor, LMX1600EVAL Datasheet - Page 14

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LMX1600EVAL

Manufacturer Part Number
LMX1600EVAL
Description
Manufacturer
National Semiconductor
Datasheet

Specifications of LMX1600EVAL

Lead Free Status / Rohs Status
Not Compliant
www.national.com
2.0 Programming Description
2.6 SERIAL DATA INPUT TIMING
Note 17: Data shifted into register on clock rising edge.
TEST CONDITIONS: The Serial Data Input Timing is tested using a symmetrical waveform around V
an edge rate of 0.6 V/ns with amplitudes of 2.2V
Data is shifted in MSB first.
@
(Continued)
V
CC
= 2.7V.
14
CC
/2. The test waveform has
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