5962-8960101B2A QP SEMICONDUCTOR, 5962-8960101B2A Datasheet - Page 12

• Manufacturer Part Number: 5962-8960101B2A
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8960101B2A

• Logic Family: ACT
• Technology: CMOS
• Number Of Bits: 8
• Number Of Elements: 1
• Clock-edge Trigger Type: Positive-Edge
• Polarity: Non-Inverting
• Operating Supply Voltage (typ): 5V
• Propagation Delay Time: 13.5ns
• Output Type: 3-State
• Low Level Output Current: 24mA
• High Level Output Current: -24mA
• Operating Supply Voltage (min): 4.5V
• Operating Supply Voltage (max): 5.5V
• Operating Temp Range: -55C to 125C
• Operating Temperature Classification: Military
• Mounting: Surface Mount
• Pin Count: 20
• Lead Free Status / Rohs Status: Not Compliant

DSCC FORM 2234
APR 97
Maximum
Input set-up time,
Input hold time,
Clock pulse width
1/ For tests not listed in the referenced MIL-STD-883 (e.g. ∆I
2/ Each input/output, as applicable shall be tested at the specified temperature for the specified limits. Output terminals not
3/ RHA parts for device type 01 are tested at all levels M, D, P, L, and R of irradiation. Pre and Post irradiation values are
4/ The word "All" in the device type and device class column, means non-RHA limits for all device types and classes. Where M,
operating
frequency
Dn (high and
low) to CP
Dn (high and
low) to CP
(high and low)
test method 1/
MIL-STD-883
herein. All inputs and outputs shall be tested, as applicable, to the tests in table I herein.
designated shall be high level logic, low level logic, or open, except as follows:
a.
b.
c.
identical unless otherwise specified in table I.
RHA parts for device type 02 meet all levels M, D, P, L, R, and F of irradiation. However, these parts are only tested at the
“F” level. Pre and post irradiation values are identical unless otherwise specified in table I.
D, P, L, R, and/or F in the conditions column are postirradiation limits for those device types and classes specified in the
device type and device class column.
Test and
V
V
All I
in the circuit such that all current flows through the meter.
DEFENSE SUPPLY CENTER COLUMBUS
IC
IC
(pos) tests, the GND terminal can be open. T
(neg) tests, the V
CC
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43216-5000
and ∆I
f
t
t
t
CC
Symbol
MAX
s
h
W
STANDARD
tests, the output terminal shall be open. When performing these tests, the current meter shall be placed
CC
terminal shall be open. T
C
R
See figure 6
See 4.4.1f
C
R
See figure 6
See 4.4.1g
C
R
See figure 6
See 4.4.1g
C
R
See figure 6
See 4.4.1g
TABLE I. Electrical performance characteristics - Continued.
unless otherwise specified
L
L
L
L
L
L
L
L
= 50 pF minimum
= 500Ω
= 50 pF minimum
= 500Ω
= 50 pF minimum
= 500Ω
= 50 pF minimum
= 500Ω
+4.5 V ≤ V
Test Conditions 2/ 3/
-55°C ≤ T
C
CC
≤ +125°C
≤ +5.5 V
C
C
= +25°C.
= +25°C.
CC
), utilize the general test procedure under the conditions listed
and device
B, S, Q, V
B, S, Q, V
Device
type 4/
class
All
All
All
All
All
All
All
All
M
M
SIZE
A
4.5 V
4.5 V
4.5 V
4.5 V
4.5 V
V
CC
REVISION LEVEL
subgroups
Group A
10, 11
10, 11
10, 11
10, 11
9, 11
9, 10
10
11
9
9
9
9
E
100
Min
3.5
3.5
1.5
2.0
1.5
2.0
5.0
5.0
70
95
70
Limits 5/
SHEET
5962-89601
Max
12
MHz
Unit
ns
ns
ns
ns