LQ150X1LGN2E Sharp Electronics, LQ150X1LGN2E Datasheet - Page 22

• Manufacturer Part Number: LQ150X1LGN2E
• Manufacturer: Sharp Electronics

Specifications of LQ150X1LGN2E

• Lead Free Status / Rohs Status: Compliant

12．Reliability test items
【Result Evaluation Criteria】
No
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9
which may affect practical display function. (normal operation state：Temperature:15∼35℃,
Under the display quality test conditions with normal operation state, these shall be no change
High temperature storage test
Test item
Low temperature storage test
High temperature
& high humidity operation test
High temperature operation test
Low temperature operation test
Vibration test
(non- operating)
Shock test
(non- operating)
Thermal shock test
(Storage)
Altitude
Humidity:45∼75％, Atmospheric pressure:86∼106kpa)
Waveform : Sine wave
Frequency : 10∼57Hz/Vibration width (one side) : 0.075mm
Sweep time : 11minutes
Test period : 3 hours
Max. gravity : 490m/s
Pulse width : 11ms, half-sine wave
Direction : ±X, ±Y, ±Z,
Ta=-25℃∼60℃ ; 5 cycles
Test period : 10 hours (1 hour for each temperature)
Ta=50℃,70kPa,3,048m(10,000ft), t=24h (Operating)
Ta=70℃,12kPa,15,240m(50,000ft), t=24h (Storage)
Conditions
Ta = 60℃
Ta = -25℃
Ta = 40℃ ; 95%RH 240h
(No condensation)
Ta = 60℃
(The temperature of panel surface)
Ta = 0℃
once for each direction.
: 57∼500Hz/Gravity : 9.8m/s
(1 hour for each direction of X,Y,Z)
240h
240h
240h
240H
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LD-18317A-19